Aspect-based On-the-Fly Testing Technique for Embedded Software

Jong-Phil Kim, Jin-Soo Park, Jang-Eui Hong

Abstract

Various techniques for testing embedded software have been proposed as a result of the increased need for high quality embedded systems. However, it is hard to perform accurate testing with these techniques on failures that can occur unexpectedly in a real environment, because most of the tests are performed in software development environment. Therefore, it needs a testing technique that can dynamically test software’s latent faults in a real environment. In this paper, we propose an aspect-based On-the-Fly testing. The purpose of which is to test the functionalities and non-functionalities of embedded software using aspect-oriented programming at run-time in a real environment. Our proposed technique provides some advantages of prevention of software malfunction in a real environment and high reusability of test code.

References

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Paper Citation


in Harvard Style

Kim J., Park J. and Hong J. (2012). Aspect-based On-the-Fly Testing Technique for Embedded Software . In Proceedings of the 7th International Conference on Software Paradigm Trends - Volume 1: ICSOFT, ISBN 978-989-8565-19-8, pages 375-380. DOI: 10.5220/0004081503750380


in Bibtex Style

@conference{icsoft12,
author={Jong-Phil Kim and Jin-Soo Park and Jang-Eui Hong},
title={Aspect-based On-the-Fly Testing Technique for Embedded Software},
booktitle={Proceedings of the 7th International Conference on Software Paradigm Trends - Volume 1: ICSOFT,},
year={2012},
pages={375-380},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0004081503750380},
isbn={978-989-8565-19-8},
}


in EndNote Style

TY - CONF
JO - Proceedings of the 7th International Conference on Software Paradigm Trends - Volume 1: ICSOFT,
TI - Aspect-based On-the-Fly Testing Technique for Embedded Software
SN - 978-989-8565-19-8
AU - Kim J.
AU - Park J.
AU - Hong J.
PY - 2012
SP - 375
EP - 380
DO - 10.5220/0004081503750380