An Automatic Vision System using Optical Scanning Mechanism with Near-infrared Optics for Solar Cell Wafer

Gyung-bum Kim

Abstract

In this paper, an automatic vision system based on optical scanning mechanism is developed for solar cell wafer. It consists of optical scanning mechanism with near-infrared(NIR) camera optics, machinery and control system, algorithm of defect detection and software. Optical scanning mechanism is composed of geometrical camera optics and structured hybrid illumination system(SHIS). It is used to inspection of surface defects. Also, NIR camera optics is used for inspection of defects inside solar cell wafer. It is shown that the automatic inspection system give satisfactory performance for micro defects in solar cell wafer.

References

  1. Li, W. C. and Tsai, D. M., 2011. Automatic Saw-mark Detection in Multi-crystalline Solar Wafer Images, Solar Energy Materials & Solar cells, DOI: 10.1016/j.solmat.2011.03.025.1.
  2. Sunil, K. K., 2006. Lighting Design for Machine Vision Application, Image & Vision Computing, Vol. 24, pp. 720-726.
  3. Golnabi, H., Asadpour, A., 2007. Design and application of industrial machine vision systems, Robotics and Computer-Integrated Manufacturing, Vol. 23, pp. 630- 637.
  4. Choi, M. Y., et al, 2006. Measurement of Defects and Stress by Infrared Thermography, Journal of Korean Society of Precision Engineers, Vol. 23, No. 10, pp. 3035.
  5. An, B. I. and Kim, G. B., 2012. Development of structured hybrid illumination system and optimum illumination condition selection for detection of surface defects on silicon wafer in solar cell, Journal of the Korean Society of Mechanical Engineers(A), Vol. 36, No. 5, pp. 336337.
  6. Cho, H. S., 2006. Optomechatronics, Taylor & Francis.
  7. Kim, G. B., 2010. A structured mechanism development and experimental parameter selection of laser scattering for the surface inspection of flat-panel glasses, International Journal of Production Research, Vol. 13, No.49, pp. 39113923.
  8. Kim, G. B., Yeon, J. S., 2011. Development of laser scattering system and inspection of micro defects in crystalline silicon wafer of solar cell, Proceedings of the 11th EUSPEN International Conference, pp.39-42.
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Paper Citation


in Harvard Style

Kim G. (2014). An Automatic Vision System using Optical Scanning Mechanism with Near-infrared Optics for Solar Cell Wafer . In Proceedings of the 4th International Conference on Pervasive and Embedded Computing and Communication Systems - Volume 1: PECCS, ISBN 978-989-758-000-0, pages 27-30. DOI: 10.5220/0004679200270030


in Bibtex Style

@conference{peccs14,
author={Gyung-bum Kim},
title={An Automatic Vision System using Optical Scanning Mechanism with Near-infrared Optics for Solar Cell Wafer},
booktitle={Proceedings of the 4th International Conference on Pervasive and Embedded Computing and Communication Systems - Volume 1: PECCS,},
year={2014},
pages={27-30},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0004679200270030},
isbn={978-989-758-000-0},
}


in EndNote Style

TY - CONF
JO - Proceedings of the 4th International Conference on Pervasive and Embedded Computing and Communication Systems - Volume 1: PECCS,
TI - An Automatic Vision System using Optical Scanning Mechanism with Near-infrared Optics for Solar Cell Wafer
SN - 978-989-758-000-0
AU - Kim G.
PY - 2014
SP - 27
EP - 30
DO - 10.5220/0004679200270030