Development of an Interhemispheric Symmetry Measurement in the Neonatal Brain

Ninah Koolen, Anneleen Dereymaeker, Katrien Jansen, Jan Vervisch, Vladimir Matic, Maarten De Vos, Gunnar Naulaers, Sabine Van Huffel

Abstract

The automated analysis of the EEG pattern of the preterm newborn would be a valuable tool in the neonatal intensive care units for the prognosis of neurological development. The analysis of the (a)symmetry between the two hemispheres can provide useful information about neuronal dysfunction in early stages. Consecutive and subgroup analyses of different brain regions will allow detecting physiologic asymmetry versus pathologic asymmetry. This can improve the assessment of the long-term neurodevelopmental outcome. We show that pathological asymmetry can be measured and detected using the channel symmetry index, which comprises the difference in power spectral density of contralateral EEG signals. To distinguish pathological from physiological normal EEG patterns, we make use of one-class SVM classifiers.

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Paper Citation


in Harvard Style

Koolen N., Dereymaeker A., Jansen K., Vervisch J., Matic V., De Vos M., Naulaers G. and Van Huffel S. (2014). Development of an Interhemispheric Symmetry Measurement in the Neonatal Brain . In Proceedings of the 3rd International Conference on Pattern Recognition Applications and Methods - Volume 1: ICPRAM, ISBN 978-989-758-018-5, pages 765-770. DOI: 10.5220/0004922407650770


in Bibtex Style

@conference{icpram14,
author={Ninah Koolen and Anneleen Dereymaeker and Katrien Jansen and Jan Vervisch and Vladimir Matic and Maarten De Vos and Gunnar Naulaers and Sabine Van Huffel},
title={Development of an Interhemispheric Symmetry Measurement in the Neonatal Brain},
booktitle={Proceedings of the 3rd International Conference on Pattern Recognition Applications and Methods - Volume 1: ICPRAM,},
year={2014},
pages={765-770},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0004922407650770},
isbn={978-989-758-018-5},
}


in EndNote Style

TY - CONF
JO - Proceedings of the 3rd International Conference on Pattern Recognition Applications and Methods - Volume 1: ICPRAM,
TI - Development of an Interhemispheric Symmetry Measurement in the Neonatal Brain
SN - 978-989-758-018-5
AU - Koolen N.
AU - Dereymaeker A.
AU - Jansen K.
AU - Vervisch J.
AU - Matic V.
AU - De Vos M.
AU - Naulaers G.
AU - Van Huffel S.
PY - 2014
SP - 765
EP - 770
DO - 10.5220/0004922407650770