New Solutions for Optimal Hardware Tests of Reconfigurable Hardware Systems

Asma Ben Ahmed, Olfa Mosbahi, Mohamed Khalgui

Abstract

This research paper deals with Reconfigurable Hardware Systems (abbreviated, RHS) that should be adapted to their environment under well-defined conditions. A reconfiguration scenario is a run-time hardware operation allowing the addition/removal of hardware components. We classify the reconfiguration scenarios into three levels: Architectural, Structural and Data Reconfiguration Levels. We propose a new solution for optimal hardware tests of RHS based on the definition of new fault collapsing relationships termed Inter-Equivalence, Inter-Dominance and Redundancy.

References

  1. Abramovici, M. and Menon, P. R. (1997). Fault simulation on reconfigurable hardware. In 5th IEEE Symposium on Field-Programmable Custom Computing Machines (FCCM 7897), 16-18 April 1997, Napa Valley, CA, USA, pages 182-191.
  2. Agrawal, V. D., Prasad, A. V. S. S., and Atre, M. V. (2003). Fault collapsing via functional dominance. In ITC, pages 274-280.
  3. Ahmadinia, A. (2007). Optimal free-space management and routing-conscious dynamic placement for reconfigurable devices. IEEE Trans. Computers, 56(5):673-680.
  4. Al-Asaad, H. and Lee, R. (2002). Simulation-based approximate global fault collapsing.
  5. Angelov, C., Sierszecki, K., and Marian, N. (2005). Design models for reusable and reconfigurable state machines. In EUC, pages 152-163.
  6. Bushnell, M. L. (2001). Essentials of electronic testing for digital, memory and mixed-signal vlsi circuits.
  7. Gharbi, A., Khalgui, M., and Ahmed, S. B. (2010). Optimal model checking of safe control embedded software components. In Proceedings of 15th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2010, September 13-16, 2010, Bilbao, Spain, pages 1-8.
  8. Khalgui, M. (2010). Nces-based modelling and ctl-based verification of reconfigurable embedded control systems. Computers in Industry, 61(3):198-212.
  9. Prasad, A. V. S. S., Agrawal, V. D., and Atre, M. V. (2002). A new algorithm for global fault collapsing into equivalence and dominance sets. In ITC, pages 391-397.
  10. Rooker, M. N., Snder, C., Strasser, T., Zoitl, A., Hummer, O., and Ebenhofer, G. (2007). Zero downtime reconfiguration of distributed automation systems: The epsiloncedac approach. In Mavrk, V., Vyatkin, V., and Colombo, A. W., editors, HoloMAS, volume 4659 of Lecture Notes in Computer Science, pages 326-337. Springer.
  11. Sethuram, R., Bushnell, M. L., and Agrawal, V. D. (2008). Fault nodes in implication graph for equivalence/dominance collapsing, and identifying untestable and independent faults. In 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA, pages 329-335.
  12. Steininger, A. (2000). Testing and built-in self-test - a survey. Journal of Systems Architecture, 46(9):721-747.
  13. Veneris, A. G., Chang, R., Abadir, M. S., and Amiri, M. (2004). Fault equivalence and diagnostic test generation using atpg. In ISCAS (5), pages 221-224.
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Paper Citation


in Harvard Style

Ben Ahmed A., Mosbahi O. and Khalgui M. (2015). New Solutions for Optimal Hardware Tests of Reconfigurable Hardware Systems . In Proceedings of the 5th International Conference on Pervasive and Embedded Computing and Communication Systems - Volume 1: PECCS, ISBN 978-989-758-084-0, pages 281-288. DOI: 10.5220/0005243902810288


in Bibtex Style

@conference{peccs15,
author={Asma Ben Ahmed and Olfa Mosbahi and Mohamed Khalgui},
title={New Solutions for Optimal Hardware Tests of Reconfigurable Hardware Systems},
booktitle={Proceedings of the 5th International Conference on Pervasive and Embedded Computing and Communication Systems - Volume 1: PECCS,},
year={2015},
pages={281-288},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0005243902810288},
isbn={978-989-758-084-0},
}


in EndNote Style

TY - CONF
JO - Proceedings of the 5th International Conference on Pervasive and Embedded Computing and Communication Systems - Volume 1: PECCS,
TI - New Solutions for Optimal Hardware Tests of Reconfigurable Hardware Systems
SN - 978-989-758-084-0
AU - Ben Ahmed A.
AU - Mosbahi O.
AU - Khalgui M.
PY - 2015
SP - 281
EP - 288
DO - 10.5220/0005243902810288