Amorphous Ge-As-Te Thin Films Prepared by Pulsed Laser Deposition - A Photostability Study

M. Bouška, P. Hawlová, V. Nazabal, L. Beneš, P. Němec

2015

Abstract

Pulsed laser deposition was used for the fabrication of amorphous thin films from Ge-As-Te system with the aim to study their intrinsic photostability. Photostability of prepared layers was studied using spectroscopic ellipsometry within as-deposited as well as relaxed layers. For irradiation, laser sources operating at three energies (1.17, 0.92 and 0.8 eV) in band gap region of the studied materials were employed. The lowest values of photorefraction (refractive index changes) accompanied with lowest changes of band gap values present Ge20As20Te60 thin films, which are therefore considered as the layers with highest photostability, especially in relaxed state.

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Paper Citation


in Harvard Style

Bouška M., Hawlová P., Nazabal V., Beneš L. and Němec P. (2015). Amorphous Ge-As-Te Thin Films Prepared by Pulsed Laser Deposition - A Photostability Study . In Proceedings of the 3rd International Conference on Photonics, Optics and Laser Technology - Volume 1: PHOTOPTICS, ISBN 978-989-758-092-5, pages 103-107. DOI: 10.5220/0005338301030107


in Bibtex Style

@conference{photoptics15,
author={M. Bouška and P. Hawlová and V. Nazabal and L. Beneš and P. Němec},
title={Amorphous Ge-As-Te Thin Films Prepared by Pulsed Laser Deposition - A Photostability Study},
booktitle={Proceedings of the 3rd International Conference on Photonics, Optics and Laser Technology - Volume 1: PHOTOPTICS,},
year={2015},
pages={103-107},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0005338301030107},
isbn={978-989-758-092-5},
}


in EndNote Style

TY - CONF
JO - Proceedings of the 3rd International Conference on Photonics, Optics and Laser Technology - Volume 1: PHOTOPTICS,
TI - Amorphous Ge-As-Te Thin Films Prepared by Pulsed Laser Deposition - A Photostability Study
SN - 978-989-758-092-5
AU - Bouška M.
AU - Hawlová P.
AU - Nazabal V.
AU - Beneš L.
AU - Němec P.
PY - 2015
SP - 103
EP - 107
DO - 10.5220/0005338301030107