In-vitro Modeling of Electrode-tissue Parameters

Maran Ma, Timothy E. Kennedy

Abstract

The long-term causes underlying the failure of neural recording electrodes is an active question in the community of neural implant users and developers. It is known that a variety of phenomena contribute to signal degradation, but to engineer better devices, the impact of each factor must be quantified and prioritized. The causes of gradual loss of signal fidelity on individual electrodes include: 1) insulation breakdown, 2) biofouling, 3) glial ensheathment, and 4) neuronal death. One challenge to teasing these factors apart is that they occur simultaneously in-vivo. Another is that impedance, the primary method of monitoring electrode status, is affected by multiple factors. The purpose of this project is to build a simple and cost effective in-vitro setup to model each phenomenon individually, and quantify its impact on both impedance spectra and electrophysiological recording quality.

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Paper Citation


in Harvard Style

Ma M. and Kennedy T. (2017). In-vitro Modeling of Electrode-tissue Parameters.In NEUROTECHNIX 2017 - Extended Abstracts - Volume 1: NEUROTECHNIX, ISBN , pages 12-13


in Bibtex Style

@conference{neurotechnix17,
author={Maran Ma and Timothy E. Kennedy},
title={In-vitro Modeling of Electrode-tissue Parameters},
booktitle={NEUROTECHNIX 2017 - Extended Abstracts - Volume 1: NEUROTECHNIX,},
year={2017},
pages={12-13},
publisher={SciTePress},
organization={INSTICC},
doi={},
isbn={},
}


in EndNote Style

TY - CONF

JO - NEUROTECHNIX 2017 - Extended Abstracts - Volume 1: NEUROTECHNIX,
TI - In-vitro Modeling of Electrode-tissue Parameters
SN -
AU - Ma M.
AU - Kennedy T.
PY - 2017
SP - 12
EP - 13
DO -