Column Scan Optimization by Increasing Intra-Instruction Parallelism

Nusrat Jahan Lisa, Annett Ungethüm, Dirk Habich, Nguyen Duy Anh Tuan, Akash Kumar, Wolfgang Lehner

Abstract

The key objective of database systems is to reliably manage data, whereby high query throughput and low query latency are core requirements. To satisfy these requirements for analytical query workloads, in-memory column store database systems are state-of-the-art. In these systems, relational tables are organized by column rather than by row, so that a full column scan is a fundamental key operation and thus, the optimization of the key operation is very crucial. For this reason, we investigated the optimization of a well-known scan technique using SIMD (Single Instruction Multiple Data) vectorization as well as using Field Programmable Gate Arrays (FPGA). In this paper, we present both optimization approaches with the goal to increase the intra-instruction execution parallelism to process more columns values in a single instruction simultaneously. For both, we present selective results of our exhaustive evaluation. Based on this evaluation, we draw some lessons learned for our ongoing research activities.

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Paper Citation


in Harvard Style

Lisa N., Ungethüm A., Habich D., Kumar A. and Lehner W. (2018). Column Scan Optimization by Increasing Intra-Instruction Parallelism.In Proceedings of the 7th International Conference on Data Science, Technology and Applications - Volume 1: DATA, ISBN 978-989-758-318-6, pages 344-353. DOI: 10.5220/0006897003440353


in Bibtex Style

@conference{data18,
author={Nusrat Jahan Lisa and Annett Ungethüm and Dirk Habich and Akash Kumar and Wolfgang Lehner},
title={Column Scan Optimization by Increasing Intra-Instruction Parallelism},
booktitle={Proceedings of the 7th International Conference on Data Science, Technology and Applications - Volume 1: DATA,},
year={2018},
pages={344-353},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0006897003440353},
isbn={978-989-758-318-6},
}


in EndNote Style

TY - CONF

JO - Proceedings of the 7th International Conference on Data Science, Technology and Applications - Volume 1: DATA,
TI - Column Scan Optimization by Increasing Intra-Instruction Parallelism
SN - 978-989-758-318-6
AU - Lisa N.
AU - Ungethüm A.
AU - Habich D.
AU - Kumar A.
AU - Lehner W.
PY - 2018
SP - 344
EP - 353
DO - 10.5220/0006897003440353