Towards an Ontological Representation of Condition Monitoring Knowledge in the Manufacturing Domain

Qiushi Cao, Cecilia Zanni-Merk, Christoph Reich

Abstract

In the manufacturing domain, machinery faults cause a company high costs. To avoid faulty conditions, the discipline of condition monitoring contributes significantly. The objective of condition monitoring is to determine the correctness of a machine, process or system. This is crucial for improving the productivity and availability of production systems. In most situations, when the tendency of a fault emerges, highly experienced and skilled professionals are capable of providing appropriate decisions about fault alarm launching and maintenance plans. However, production systems are becoming more complicated, and it is more likely that the professionals fail to respond to the faulty conditions timely and accurately. In this paper, we present an ontological framework, that is used for developing an intelligent system, which can provide decisions about alarm launching and maintenance plans in an intelligent and optimal manner. This framework is based on an ontological representation of condition monitoring knowledge in the manufacturing domain. The framework consists of an ontology structure which includes a core reference ontology for representing general condition monitoring concepts and relations, and several domain ontologies for formalizing manufacturing domain-specific knowledge.

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Paper Citation


in Harvard Style

Cao Q., Zanni-Merk C. and Reich C. (2018). Towards an Ontological Representation of Condition Monitoring Knowledge in the Manufacturing Domain.In Proceedings of the 10th International Joint Conference on Knowledge Discovery, Knowledge Engineering and Knowledge Management - Volume 2: KEOD, ISBN 978-989-758-330-8, pages 312-318. DOI: 10.5220/0006957903120318


in Bibtex Style

@conference{keod18,
author={Qiushi Cao and Cecilia Zanni-Merk and Christoph Reich},
title={Towards an Ontological Representation of Condition Monitoring Knowledge in the Manufacturing Domain},
booktitle={Proceedings of the 10th International Joint Conference on Knowledge Discovery, Knowledge Engineering and Knowledge Management - Volume 2: KEOD,},
year={2018},
pages={312-318},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0006957903120318},
isbn={978-989-758-330-8},
}


in EndNote Style

TY - CONF

JO - Proceedings of the 10th International Joint Conference on Knowledge Discovery, Knowledge Engineering and Knowledge Management - Volume 2: KEOD,
TI - Towards an Ontological Representation of Condition Monitoring Knowledge in the Manufacturing Domain
SN - 978-989-758-330-8
AU - Cao Q.
AU - Zanni-Merk C.
AU - Reich C.
PY - 2018
SP - 312
EP - 318
DO - 10.5220/0006957903120318