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Authors: Robinson Crusoé da Cruz 1 and Marcelo Medeiros Eler 2

Affiliations: 1 University of São Paulo and Centro Universitario do Planalto de Araxá–UNIARAXÁ, Brazil ; 2 University of São Paulo, Brazil

Keyword(s): : Testability, Testing, Metrics, CK, Code Coverage, Mutation Score.

Related Ontology Subjects/Areas/Topics: Enterprise Information Systems ; Information Systems Analysis and Specification ; Software Engineering ; Software Metrics and Measurement

Abstract: : In this paper we investigate the correlation between test coverage, mutation score and object-oriented systems metrics. First we conducted a literature review to obtain an initial model of testability and existing object-oriented metrics related to testability. Thus we selected four open source system whose test cases were available and calculated the correlation between the metrics collected and the line coverage, branches coverage and mutation score. Preliminary results show that some CK metrics, which are strongly related to system’s design, influence mainly line coverage and mutation score, thus they can influence systems testability.

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Paper citation in several formats:
da Cruz, R. and Medeiros Eler, M. (2017). An Empirical Analysis of the Correlation between CK Metrics, Test Coverage and Mutation Score. In Proceedings of the 19th International Conference on Enterprise Information Systems - Volume 2: ICEIS; ISBN 978-989-758-248-6; ISSN 2184-4992, SciTePress, pages 341-350. DOI: 10.5220/0006312703410350

@conference{iceis17,
author={Robinson Crusoé {da Cruz}. and Marcelo {Medeiros Eler}.},
title={An Empirical Analysis of the Correlation between CK Metrics, Test Coverage and Mutation Score},
booktitle={Proceedings of the 19th International Conference on Enterprise Information Systems - Volume 2: ICEIS},
year={2017},
pages={341-350},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0006312703410350},
isbn={978-989-758-248-6},
issn={2184-4992},
}

TY - CONF

JO - Proceedings of the 19th International Conference on Enterprise Information Systems - Volume 2: ICEIS
TI - An Empirical Analysis of the Correlation between CK Metrics, Test Coverage and Mutation Score
SN - 978-989-758-248-6
IS - 2184-4992
AU - da Cruz, R.
AU - Medeiros Eler, M.
PY - 2017
SP - 341
EP - 350
DO - 10.5220/0006312703410350
PB - SciTePress