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Authors: Fernanda Rodríguez ; Federico Lecumberry and Alicia Fernández

Affiliation: Facultad de Ingeniería and Universidad de la República, Uruguay

ISBN: 978-989-758-018-5

ISSN: 2184-4313

Keyword(s): Electricity Fraud, Support Vector Machine, Optimum Path Forest, Unbalance Class Problem, Combining Classifier, UTE.

Related Ontology Subjects/Areas/Topics: Applications ; Economics, Business and Forecasting Applications ; Pattern Recognition

Abstract: Non-technical losses detection is a complex task, with high economic impact. The diversity and big number of consumption records, makes it very important to find an efficient automatic method for detection the largest number of frauds with the least amount of experts’ hours involved in preprocessing and inspections. This article analyzes the performance of a strategy based on learning from expert labeling: suspect/no-suspect, with one using inspection labels: fraud/no-fraud. Results show that the proposed framework, suitable for imbalance problems, improves performance in terms of the Fmeasure with inspection labels, avoiding hours of experts labeling.

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Paper citation in several formats:
Rodríguez, F.; Lecumberry, F. and Fernández, A. (2014). Non Technical Loses Detection - Experts Labels vs. Inspection Labels in the Learning Stage.In Proceedings of the 3rd International Conference on Pattern Recognition Applications and Methods - Volume 1: ICPRAM, ISBN 978-989-758-018-5, ISSN 2184-4313, pages 624-628. DOI: 10.5220/0004823506240628

@conference{icpram14,
author={Fernanda Rodríguez. and Federico Lecumberry. and Alicia Fernández.},
title={Non Technical Loses Detection - Experts Labels vs. Inspection Labels in the Learning Stage},
booktitle={Proceedings of the 3rd International Conference on Pattern Recognition Applications and Methods - Volume 1: ICPRAM,},
year={2014},
pages={624-628},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0004823506240628},
isbn={978-989-758-018-5},
}

TY - CONF

JO - Proceedings of the 3rd International Conference on Pattern Recognition Applications and Methods - Volume 1: ICPRAM,
TI - Non Technical Loses Detection - Experts Labels vs. Inspection Labels in the Learning Stage
SN - 978-989-758-018-5
AU - Rodríguez, F.
AU - Lecumberry, F.
AU - Fernández, A.
PY - 2014
SP - 624
EP - 628
DO - 10.5220/0004823506240628

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