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Authors: Anna Derezińska and Sofia Krutko

Affiliation: Warsaw University of Technology, Institute of Computer Science, Nowowiejska 15/19, Warsaw, Poland

Keyword(s): Fault Localization, SBFL, Mutation Testing, MBFL.

Abstract: Research on fault localization techniques focuses on their efficiency and cost reduction. Spectra-Based Fault Localization (SBFL) counts to the mostly used methods. Hybrid approaches have been shown to be beneficial. We discuss the challenges of a revised approach combining SBFL with mutation testing. Certain unconvinced issues of mutation testing have been identified, and a practical framework has been prepared to evaluate different variants of the approach. Building a new repository with faulty programs has been launched in order to study the approach not only on the commonly used legacy programs, but also on faulty programs of more contemporary versions of the Java language and unit tests.

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Paper citation in several formats:
Derezińska, A. and Krutko, S. (2022). Combining SBFL with Mutation Testing: Challenges of a Practical Approach. In Proceedings of the 17th International Conference on Evaluation of Novel Approaches to Software Engineering - ENASE; ISBN 978-989-758-568-5; ISSN 2184-4895, SciTePress, pages 544-552. DOI: 10.5220/0011093500003176

@conference{enase22,
author={Anna Derezińska. and Sofia Krutko.},
title={Combining SBFL with Mutation Testing: Challenges of a Practical Approach},
booktitle={Proceedings of the 17th International Conference on Evaluation of Novel Approaches to Software Engineering - ENASE},
year={2022},
pages={544-552},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0011093500003176},
isbn={978-989-758-568-5},
issn={2184-4895},
}

TY - CONF

JO - Proceedings of the 17th International Conference on Evaluation of Novel Approaches to Software Engineering - ENASE
TI - Combining SBFL with Mutation Testing: Challenges of a Practical Approach
SN - 978-989-758-568-5
IS - 2184-4895
AU - Derezińska, A.
AU - Krutko, S.
PY - 2022
SP - 544
EP - 552
DO - 10.5220/0011093500003176
PB - SciTePress