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Authors: Zeina Abu-Aisheh ; Romain Raveaux ; Jean-Yves Ramel and Patrick Martineau

Affiliation: Université François Rabelais, France

Keyword(s): Graph Matching, Graph Edit Distance, Pattern Recognition, Classification.

Related Ontology Subjects/Areas/Topics: Classification ; Graphical and Graph-Based Models ; Pattern Recognition ; Theory and Methods

Abstract: Graph edit distance is an error tolerant matching technique emerged as a powerful and flexible graph matching paradigm that can be used to address different tasks in pattern recognition, machine learning and data mining; it represents the minimum-cost sequence of basic edit operations to transform one graph into another by means of insertion, deletion and substitution of vertices and/or edges. A widely used method for exact graph edit distance computation is based on the A* algorithm. To overcome its high memory load while traversing the search tree for storing pending solutions to be explored, we propose a depth-first graph edit distance algorithm which requires less memory and searching time. An evaluation of all possible solutions is performed without explicitly enumerating them all. Candidates are discarded using an upper and lower bounds strategy. A solid experimental study is proposed; experiments on a publicly available database empirically demonstrated that our approach is be tter than the A* graph edit distance computation in terms of speed, accuracy and classification rate. (More)

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Paper citation in several formats:
Abu-Aisheh, Z.; Raveaux, R.; Ramel, J. and Martineau, P. (2015). An Exact Graph Edit Distance Algorithm for Solving Pattern Recognition Problems. In Proceedings of the International Conference on Pattern Recognition Applications and Methods - Volume 1: ICPRAM; ISBN 978-989-758-076-5; ISSN 2184-4313, SciTePress, pages 271-278. DOI: 10.5220/0005209202710278

@conference{icpram15,
author={Zeina Abu{-}Aisheh. and Romain Raveaux. and Jean{-}Yves Ramel. and Patrick Martineau.},
title={An Exact Graph Edit Distance Algorithm for Solving Pattern Recognition Problems},
booktitle={Proceedings of the International Conference on Pattern Recognition Applications and Methods - Volume 1: ICPRAM},
year={2015},
pages={271-278},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0005209202710278},
isbn={978-989-758-076-5},
issn={2184-4313},
}

TY - CONF

JO - Proceedings of the International Conference on Pattern Recognition Applications and Methods - Volume 1: ICPRAM
TI - An Exact Graph Edit Distance Algorithm for Solving Pattern Recognition Problems
SN - 978-989-758-076-5
IS - 2184-4313
AU - Abu-Aisheh, Z.
AU - Raveaux, R.
AU - Ramel, J.
AU - Martineau, P.
PY - 2015
SP - 271
EP - 278
DO - 10.5220/0005209202710278
PB - SciTePress

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