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Authors: Yu-Chen Hsieh ; Ching-Ching Yang ; Chih-Chung Yang ; Yu-Hsuan Lin ; Kuo-Cheng Huang and Wen-Tse Hsiao

Affiliation: Instrument Technology Research Center, National Applied Research Laboratories, 20, R&D Rd. VI. Hsinchu Science Park, Hsinchu City, Taiwan

ISBN: 978-989-758-364-3

Keyword(s): Ultraviolet Laser System, Low-temperature Annealing, Aluminum Doped Zinc Oxide Films, Induced-crystalline, Residual Stress Analysis.

Abstract: In this study, a low-temperature annealing technique using an ultraviolet laser was proposed for inducing the crystallization of transparent conductive aluminum-doped zinc oxide (AZO) films. The technique was used in conjunction with a galvanometer scanner to adjust the laser energy density and scanning speed, thereby inducing the amorphous crystallization of thin films. X-ray diffraction was used to analyze the structural properties of annealed thin films. Analysis with different galvanometer scanning speed during annealing and laser pulse repetition rates during annealing revealed that the two diffraction peaks (i.e., the (002) and (103) peaks) of the zinc oxide thin films became more noticeable as the laser pulse repetition rate increased. When the galvanometer scanning speed during annealing was set to 400 mm/s and 600 mm/s, the full width at half of the maximum (FWHM) of the AZO thin films decreased while the annealing frequency increased. By contrast, when the annealing speed wa s 800 mm/s, increasing the annealing frequency caused the FWHM to decrease and then increase. An analysis of the residual stress of the annealed thin film confirmed that when the annealing speed was reduced from 800 mm/s to 400 mm/s, increases in laser pulse repetition rate resulted in increased residual stress. (More)

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Paper citation in several formats:
Hsieh, Y.; Yang, C.; Yang, C.; Lin, Y.; Huang, K. and Hsiao, W. (2019). Residual Stress Analysis of Aluminum-doped Zinc Oxide Films under Laser-Induced Recovery Process.In Proceedings of the 7th International Conference on Photonics, Optics and Laser Technology - Volume 1: PHOTOPTICS, ISBN 978-989-758-364-3, pages 134-138. DOI: 10.5220/0007363601340138

@conference{photoptics19,
author={Yu{-}Chen Hsieh. and Ching{-}Ching Yang. and Chih{-}Chung Yang. and Yu{-}Hsuan Lin. and Kuo{-}Cheng Huang. and Wen{-}Tse Hsiao.},
title={Residual Stress Analysis of Aluminum-doped Zinc Oxide Films under Laser-Induced Recovery Process},
booktitle={Proceedings of the 7th International Conference on Photonics, Optics and Laser Technology - Volume 1: PHOTOPTICS,},
year={2019},
pages={134-138},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0007363601340138},
isbn={978-989-758-364-3},
}

TY - CONF

JO - Proceedings of the 7th International Conference on Photonics, Optics and Laser Technology - Volume 1: PHOTOPTICS,
TI - Residual Stress Analysis of Aluminum-doped Zinc Oxide Films under Laser-Induced Recovery Process
SN - 978-989-758-364-3
AU - Hsieh, Y.
AU - Yang, C.
AU - Yang, C.
AU - Lin, Y.
AU - Huang, K.
AU - Hsiao, W.
PY - 2019
SP - 134
EP - 138
DO - 10.5220/0007363601340138

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