Authors:
            
                    Silas E. Nachif Fernandes
                    
                        
                                1
                            
                                ; 
                            
                                3
                            
                    
                    ; 
                
                    Leandro Passos
                    
                        
                                2
                            
                    
                    ; 
                
                    Danilo Jodas
                    
                        
                                1
                            
                    
                    ; 
                
                    André Souza
                    
                        
                                3
                            
                    
                     and
                
                    João Papa
                    
                        
                                1
                            
                    
                    
                
        
        
            Affiliations:
            
                    
                        
                                1
                            
                    
                    Department of Computing, São Paulo State University, Bauru, Brazil
                
                    ; 
                
                    
                        
                                2
                            
                    
                    School of Engineering and Informatics, University Wolverhampton, Wolverhampton, England, U.K.
                
                    ; 
                
                    
                        
                                3
                            
                    
                    Department of Electrical Engineering, São Paulo State University, Bauru, Brazil
                
        
        
        
        
        
             Keyword(s):
            Optimum-Path Forest, Probabilistic Classification, Multi-Class.
        
        
            
                
                
            
        
        
            
                Abstract: 
                The advent of machine learning provided numerous benefits to humankind, impacting fields such as medicine, military, and entertainment, to cite a few. In most cases, given some instances from a previously known domain, the intelligent algorithm is encharged of predicting a label that categorizes such samples in some learned context. Among several techniques capable of accomplishing such classification tasks, one may refer to Support Vector Machines, Neural Networks, or graph-based classifiers, such as the Optimum-Path Forest (OPF). Even though such a paradigm satisfies a wide sort of problems, others require the predicted class label and the classifier’s confidence, i.e., how sure the model is while attributing labels. Recently, an OPF-based variant was proposed to tackle this problem, i.e., the Probabilistic Optimum-Path Forest. Despite its satisfactory results over a considerable number of datasets, it was conceived to deal with binary classification only, thus lacking in the conte
                xt of multi-class problems. Therefore, this paper proposes the Multi-Class Probabilistic Optimum-Path Forest, an extension designed to outdraw limitations observed in the standard Probabilistic OPF.
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