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Authors: Ariel Schwarz 1 ; Nisan Ozana 2 ; Amir Semer 1 ; Ran Califa 3 ; Hadar Genish 3 and Zeev Zalevsky 2

Affiliations: 1 Faculty of Engineering and the Nanotechnology Center, Bar Ilan University, Webb 1, Ramat Gan, Israel, Department of Electrical Engineering, Jerusalem College of Engineering, Schreiboim 26, Jerusalem, Israel ; 2 Faculty of Engineering and the Nanotechnology Center, Bar Ilan University, Webb 1, Ramat Gan, Israel ; 3 ContinUse Biometrics Ltd., HaBarzel 32b, Tel Aviv, Israel

ISBN: 978-989-758-364-3

Keyword(s): Lasers, Speckle Interferometry, Scattering, Rough Surfaces, Fourier Optics and Signal Processing.

Abstract: In this paper, we describe a technique for elasticity and depth measurement via both secondary speckle and time multiplexing interference approach. Using external stimulation of elastic medium (in example: human tissue) by infra-sonic vibration, photons from different depths of the elastic medium were separated. In addition, this work uses a modulated laser that incorporates at the same scanning time, a speckle pattern tracking method for sensing surface tilting and interferometer method for sensing z-axis movements. In this paper, we present preliminary experiments showing the ability to separate data of light coming from different layers in the elastic medium.

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Paper citation in several formats:
Schwarz, A.; Ozana, N.; Semer, A.; Califa, R.; Genish, H. and Zalevsky, Z. (2019). Elasticity and Depth Measurement using Both Secondary Speckle and Time Multiplexing Interference.In Proceedings of the 7th International Conference on Photonics, Optics and Laser Technology - Volume 1: PHOTOPTICS, ISBN 978-989-758-364-3, pages 255-262. DOI: 10.5220/0007521702550262

@conference{photoptics19,
author={Ariel Schwarz. and Nisan Ozana. and Amir Semer. and Ran Califa. and Hadar Genish. and Zeev Zalevsky.},
title={Elasticity and Depth Measurement using Both Secondary Speckle and Time Multiplexing Interference},
booktitle={Proceedings of the 7th International Conference on Photonics, Optics and Laser Technology - Volume 1: PHOTOPTICS,},
year={2019},
pages={255-262},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0007521702550262},
isbn={978-989-758-364-3},
}

TY - CONF

JO - Proceedings of the 7th International Conference on Photonics, Optics and Laser Technology - Volume 1: PHOTOPTICS,
TI - Elasticity and Depth Measurement using Both Secondary Speckle and Time Multiplexing Interference
SN - 978-989-758-364-3
AU - Schwarz, A.
AU - Ozana, N.
AU - Semer, A.
AU - Califa, R.
AU - Genish, H.
AU - Zalevsky, Z.
PY - 2019
SP - 255
EP - 262
DO - 10.5220/0007521702550262

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