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Authors: Suzan Meijs 1 ; Søren Sørensen 2 ; Kristian Rechendorff 2 and Nico Rijkhoff 1

Affiliations: 1 Aalborg University, Denmark ; 2 Danish Technological Institute, Denmark

Keyword(s): Electrical Stimulation, Charge Injection, Implantable Neural Prosthesis.

Related Ontology Subjects/Areas/Topics: Electrical Stimulation ; Health Engineering and Technology Applications ; Neuro-Interface Prosthetic Devices ; Neuromodulation and Neural Prosthesis ; NeuroSensing and Diagnosis ; Neurotechnology, Electronics and Informatics

Abstract: The effect of unsafe stimulation on charge injection limits (Qinj) and pulsing capacitance (Cpulse) was investigated. Four stimulation protocols were applied: 20 mA – 200 and 400 Hz, 50 mA – 200 and 400 Hz. Increasing Qinj and Cpulse were observed for all stimulation protocols. Corrosion was not observed with any of the stimulation protocols and no tissue damage was observed for the 20 mA – 200 Hz stimulation group. This indicates that the ‘safe potential window’ may not be applicable in vivo, as no damage was done stimulating with 20 mA at 200 Hz, while damage was done using the same current at 400 Hz.

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Paper citation in several formats:
Meijs, S.; Sørensen, S.; Rechendorff, K. and Rijkhoff, N. (2015). In Vivo Charge Injection Limits Increased after 'Unsafe' Stimulation. In Proceedings of the 3rd International Congress on Neurotechnology, Electronics and Informatics - NEUROTECHNIX; ISBN 978-989-758-161-8, SciTePress, pages 101-105. DOI: 10.5220/0005606301010105

@conference{neurotechnix15,
author={Suzan Meijs. and Søren Sørensen. and Kristian Rechendorff. and Nico Rijkhoff.},
title={In Vivo Charge Injection Limits Increased after 'Unsafe' Stimulation},
booktitle={Proceedings of the 3rd International Congress on Neurotechnology, Electronics and Informatics - NEUROTECHNIX},
year={2015},
pages={101-105},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0005606301010105},
isbn={978-989-758-161-8},
}

TY - CONF

JO - Proceedings of the 3rd International Congress on Neurotechnology, Electronics and Informatics - NEUROTECHNIX
TI - In Vivo Charge Injection Limits Increased after 'Unsafe' Stimulation
SN - 978-989-758-161-8
AU - Meijs, S.
AU - Sørensen, S.
AU - Rechendorff, K.
AU - Rijkhoff, N.
PY - 2015
SP - 101
EP - 105
DO - 10.5220/0005606301010105
PB - SciTePress