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Authors: Bruno Oliveira 1 and Orlando Belo 2

Affiliations: 1 CIICESI, School of Management and Technology and Porto Polytechnic, Portugal ; 2 University of Minho, Portugal

Keyword(s): ETL Sketching, Patterns, Pattern-oriented Approach, Conceptual Design, BPMN, Logical Design, ETL Physical Implementation.

Related Ontology Subjects/Areas/Topics: Data Warehouses and OLAP ; Databases and Information Systems Integration ; Enterprise Information Systems ; Information Systems Analysis and Specification ; Software Engineering

Abstract: The ETL systems development has been the focus of many research works, addressing the complexity and effort required for their implementation and maintenance, and proposing several techniques that represent valuable contributions to improve the ETL final quality. In the last few years, we presented a pattern-oriented approach for developing these systems based on patterns that encapsulate well-known design techniques. Basically, patterns embed common practices using abstract components that can be configured for enabling its instantiation according to each pattern rule. However, each ETL system is unique, dealing with very specific data structures and decision-making requirements. Thus, several operational requirements need to be considered and system correctness is hard to validate, which can result in several implementation problems. In this paper, we present a conceptual approach based on patterns covering the main ETL phases, ranging from the conceptual design to its enrichment a t logical phases that can be used for the generation of executable programs. (More)

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Paper citation in several formats:
Oliveira, B. and Belo, O. (2018). From ETL Conceptual Design to ETL Physical Sketching using Patterns. In Proceedings of the 20th International Conference on Enterprise Information Systems - Volume 1: ICEIS; ISBN 978-989-758-298-1; ISSN 2184-4992, SciTePress, pages 262-269. DOI: 10.5220/0006807702620269

@conference{iceis18,
author={Bruno Oliveira. and Orlando Belo.},
title={From ETL Conceptual Design to ETL Physical Sketching using Patterns},
booktitle={Proceedings of the 20th International Conference on Enterprise Information Systems - Volume 1: ICEIS},
year={2018},
pages={262-269},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0006807702620269},
isbn={978-989-758-298-1},
issn={2184-4992},
}

TY - CONF

JO - Proceedings of the 20th International Conference on Enterprise Information Systems - Volume 1: ICEIS
TI - From ETL Conceptual Design to ETL Physical Sketching using Patterns
SN - 978-989-758-298-1
IS - 2184-4992
AU - Oliveira, B.
AU - Belo, O.
PY - 2018
SP - 262
EP - 269
DO - 10.5220/0006807702620269
PB - SciTePress