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Authors: Jong-Phil Kim ; Jin-Soo Park and Jang-Eui Hong

Affiliation: Chungbuk National University, Korea, Republic of

Keyword(s): Aspect-oriented Programming, On-the-Fly Testing, Embedded Software.

Related Ontology Subjects/Areas/Topics: Aspects ; Aspects Interference and Composition ; Aspects Testing and Verification ; Modularity with Aspects ; Paradigm Trends ; Software Engineering

Abstract: Various techniques for testing embedded software have been proposed as a result of the increased need for high quality embedded systems. However, it is hard to perform accurate testing with these techniques on failures that can occur unexpectedly in a real environment, because most of the tests are performed in software development environment. Therefore, it needs a testing technique that can dynamically test software’s latent faults in a real environment. In this paper, we propose an aspect-based On-the-Fly testing. The purpose of which is to test the functionalities and non-functionalities of embedded software using aspect-oriented programming at run-time in a real environment. Our proposed technique provides some advantages of prevention of software malfunction in a real environment and high reusability of test code.

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Paper citation in several formats:
Kim, J.; Park, J. and Hong, J. (2012). Aspect-based On-the-Fly Testing Technique for Embedded Software. In Proceedings of the 7th International Conference on Software Paradigm Trends - ICSOFT; ISBN 978-989-8565-19-8; ISSN 2184-2833, SciTePress, pages 375-380. DOI: 10.5220/0004081503750380

@conference{icsoft12,
author={Jong{-}Phil Kim. and Jin{-}Soo Park. and Jang{-}Eui Hong.},
title={Aspect-based On-the-Fly Testing Technique for Embedded Software},
booktitle={Proceedings of the 7th International Conference on Software Paradigm Trends - ICSOFT},
year={2012},
pages={375-380},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0004081503750380},
isbn={978-989-8565-19-8},
issn={2184-2833},
}

TY - CONF

JO - Proceedings of the 7th International Conference on Software Paradigm Trends - ICSOFT
TI - Aspect-based On-the-Fly Testing Technique for Embedded Software
SN - 978-989-8565-19-8
IS - 2184-2833
AU - Kim, J.
AU - Park, J.
AU - Hong, J.
PY - 2012
SP - 375
EP - 380
DO - 10.5220/0004081503750380
PB - SciTePress

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