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Authors: James Beil 1 ; Rebecca Swertfeger 1 ; Stephen Misak 1 ; Zihe Gao 2 ; Kent D. Choquette 2 and Paul O. Leisher 1

Affiliations: 1 Rose-Hulman Institute of Technology, United States ; 2 University of Illinois Urbana-Champaign, United States

Keyword(s): Beam Quality, Beam Propagation Factor, Beam Parameter Product, Diffraction-Limited, Gaussian, near-Field, Far-Field, Beam Waist, Divergence Angle, Free-Space Optical Communications, Semiconductor Laser, Diode Laser, Beam Metrics.

Related Ontology Subjects/Areas/Topics: Lasers ; Optical Communications and Networking ; Optics ; Photonics, Optics and Laser Technology ; Semiconductor Lasers and Leds ; Waveguide Lasers

Abstract: The beam propagation factor, M2, exists as one of very few measures of a laser’s performance, when really a more detailed analysis of the application and laser are necessary for judgement in most cases. In free-space optical communications, a crucial figure of merit is the proportion of diffraction-limited power in the farfield. A calculated structure has been made with a higher proportion of diffraction-limited power in the farfield than another calculated structure with a much better M2. This calculated structure has an M2 of 19, with 89% of its power within the diffraction limit in the far-field, compared to another calculated structure with M2 of 1.7 that has 86% of its power within the diffraction limit in the far-field.

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Paper citation in several formats:
Beil, J.; Swertfeger, R.; Misak, S.; Gao, Z.; Choquette, K. and Leisher, P. (2017). Semiconductor Laser Beam Quality Metrics for Free-Space Optical Communications. In Proceedings of the 5th International Conference on Photonics, Optics and Laser Technology - PHOTOPTICS; ISBN 978-989-758-223-3; ISSN 2184-4364, SciTePress, pages 196-201. DOI: 10.5220/0006122601960201

@conference{photoptics17,
author={James Beil. and Rebecca Swertfeger. and Stephen Misak. and Zihe Gao. and Kent D. Choquette. and Paul O. Leisher.},
title={Semiconductor Laser Beam Quality Metrics for Free-Space Optical Communications},
booktitle={Proceedings of the 5th International Conference on Photonics, Optics and Laser Technology - PHOTOPTICS},
year={2017},
pages={196-201},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0006122601960201},
isbn={978-989-758-223-3},
issn={2184-4364},
}

TY - CONF

JO - Proceedings of the 5th International Conference on Photonics, Optics and Laser Technology - PHOTOPTICS
TI - Semiconductor Laser Beam Quality Metrics for Free-Space Optical Communications
SN - 978-989-758-223-3
IS - 2184-4364
AU - Beil, J.
AU - Swertfeger, R.
AU - Misak, S.
AU - Gao, Z.
AU - Choquette, K.
AU - Leisher, P.
PY - 2017
SP - 196
EP - 201
DO - 10.5220/0006122601960201
PB - SciTePress