Authors:
Heinz Christian Steinhausen
;
Dennis den Brok
;
Sebastian Merzbach
;
Michael Weinmann
and
Reinhard Klein
Affiliation:
University of Bonn, Germany
Keyword(s):
Appearance, Spatially Varying Reflectance, Reflectance Modeling, Digitization.
Related
Ontology
Subjects/Areas/Topics:
Applications
;
Computer Vision, Visualization and Computer Graphics
;
Geometry and Modeling
;
Image-Based Modeling
;
Lighting and Appearance
;
Pattern Recognition
;
Rendering
;
Software Engineering
;
Texture Models, Analysis, and Synthesis
Abstract:
Analytical SVBRDF representations are widely used to represent spatially varying material appearance depending
on view and light configurations. State-of-the-art industry-grade SVBRDF acquisition devices allow
the acquisition within several minutes. For many materials with a surface reflectance behavior exhibiting
complex effects of light exchange such as inter-reflections, self-occlusions or local subsurface scattering,
SVBRDFs cannot accurately capture material appearance. We therefore propose a method to transform
SVBRDF acquisition devices to full BTF acquisition devices. To this end, we use data-driven linear models
obtained from a database of BTFs captured with a traditional BTF acquisition device in order to reconstruct
high-resolution BTFs from the SVBRDF acquisition devices’ sparse measurements. We deal with the high
degree of sparsity using Tikhonov regularization. In our evaluation, we validate our approach on several materials
and show that BTF-like material appearance ca
n be generated from SVBRDF measurements in the range
of several minutes.
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