loading
Documents

Research.Publish.Connect.

Paper

Paper Unlock

Authors: Guangling Dong 1 ; Chi He 2 ; Zhenguo Dai 3 ; Yanchang Huang 3 and Xiaochu Hang 3

Affiliations: 1 Harbin Institute of Technology, China ; 2 CUST, China ; 3 Baicheng Ordnance Test Center of China, China

ISBN: 978-989-758-120-5

Keyword(s): Missile Hit Accuracy, Integrated Test Design, Bayesian Sample Size Determination, Power Prior, Design Prior.

Related Ontology Subjects/Areas/Topics: Application Domains ; Artificial Intelligence ; Formal Methods ; Informatics in Control, Automation and Robotics ; Intelligent Control Systems and Optimization ; Military and Defense ; Optimization Issues ; Performance Analysis ; Planning and Scheduling ; Simulation and Modeling ; Simulation Tools and Platforms ; Symbolic Systems

Abstract: Sample size determination (SSD) for integrated test of missile hit accuracy is addressed in this paper. Bayesian approach to SSD gives test designer the possibility of taking into account of prior information and uncertainty on unknown parameters of interest. This fact offers the advantage of removing or mitigating typical drawbacks of classical methods, which might lead to serious miscalculation of the sample size. However, standard power prior based Bayesian SSD method cannot cope with integrated SSD for both simulation test and field test, as large numbers of simulation samples would cause contradiction between design prior and average posterior variance criterion (APVC). In allusion to this problem, we propose a test design effect equivalent method for equivalent sample size (ESS) calculation, which combined simulation credibility, sample size, and power prior exponent to get a rational design prior for subsequent field test. Average posterior variance (APV) of interested paramete rs is deduced by simulation credibility, sample sizes of two kinds of test, and prior distribution parameters. Thus, we get optimal design equations of integrated test scheme under both test cost constraints and required posterior precision constraint, whose effectiveness are illustrated with two examples. (More)

PDF ImageFull Text

Download
CC BY-NC-ND 4.0

Sign In Guest: Register as new SciTePress user now for free.

Sign In SciTePress user: please login.

PDF ImageMy Papers

You are not signed in, therefore limits apply to your IP address 35.175.200.4

In the current month:
Recent papers: 100 available of 100 total
2+ years older papers: 200 available of 200 total

Paper citation in several formats:
Dong, G.; He, C.; Dai, Z.; Dai, Z.; Huang, Y. and Hang, X. (2015). Bayesian Sample Size Optimization Method for Integrated Test Design of Missile Hit Accuracy.In Proceedings of the 5th International Conference on Simulation and Modeling Methodologies, Technologies and Applications - Volume 1: SIMULTECH, ISBN 978-989-758-120-5, pages 244-253. DOI: 10.5220/0005510902440253

@conference{simultech15,
author={Guangling Dong. and Chi He. and Zhenguo Dai. and Zhenguo Dai. and Yanchang Huang. and Xiaochu Hang.},
title={Bayesian Sample Size Optimization Method for Integrated Test Design of Missile Hit Accuracy},
booktitle={Proceedings of the 5th International Conference on Simulation and Modeling Methodologies, Technologies and Applications - Volume 1: SIMULTECH,},
year={2015},
pages={244-253},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0005510902440253},
isbn={978-989-758-120-5},
}

TY - CONF

JO - Proceedings of the 5th International Conference on Simulation and Modeling Methodologies, Technologies and Applications - Volume 1: SIMULTECH,
TI - Bayesian Sample Size Optimization Method for Integrated Test Design of Missile Hit Accuracy
SN - 978-989-758-120-5
AU - Dong, G.
AU - He, C.
AU - Dai, Z.
AU - Dai, Z.
AU - Huang, Y.
AU - Hang, X.
PY - 2015
SP - 244
EP - 253
DO - 10.5220/0005510902440253

Login or register to post comments.

Comments on this Paper: Be the first to review this paper.