Authors:
Hélène Le Bouder
1
;
Thierno Barry
2
;
Damien Couroussé
2
;
Jean-Louis Lanet
1
and
Ronan Lashermes
1
Affiliations:
1
INRIA, France
;
2
Univ. Grenoble Alpes and CEA, France
Keyword(s):
Template Attack, Side Channel Analysis, Electromagnetic Emission, VERIFY PIN Algorithm, Embedded Systems’ Security.
Related
Ontology
Subjects/Areas/Topics:
Access Control
;
Data Engineering
;
Databases and Data Security
;
Information and Systems Security
;
Internet Technology
;
Personal Data Protection for Information Systems
;
Security and Privacy in Mobile Systems
;
Software Security
;
Web Information Systems and Technologies
Abstract:
This paper presents the first side channel analysis from electromagnetic emissions on VERIFY PIN algorithms.
To enter a PIN code, a user has a limited number of trials. Therefore the main difficulty of the attack is to
succeed with very few traces. More precisely, this work implements a template attack and experimentally
verifies its success rate. It becomes a new real threat, and it is feasible on a low cost and portable platform.
Moreover, this paper shows that some protections for VERIFY PIN algorithms against fault attacks introduce
new vulnerabilities with respect to side channel analysis.