Authors:
Rasim Caner Çalık
;
Emre Tunali
;
Burak Ercan
and
Sinan Öz
Affiliation:
ASELSAN Inc. Microelectronics and Guidance and Electro-Optics Division, Turkey
Keyword(s):
Infrared Focal Plane Array, Non-uniformity Correction, Bad Pixel Detection, Bad Pixel Replacement.
Related
Ontology
Subjects/Areas/Topics:
Computer Vision, Visualization and Computer Graphics
;
Device Calibration, Characterization and Modeling
;
Image Formation and Preprocessing
;
Image Formation, Acquisition Devices and Sensors
;
Image Generation Pipeline: Algorithms and Techniques
Abstract:
Imaging systems that are benefiting from infrared focal plane arrays (IRFPA) inevitably suffer from some
visually unpleasant artifacts due to limits of detector materials and manufacturing processes. To address
these artifacts and benefit the most from IRFPAs, factory level calibrations become obligatory. Considering
nonlinear characteristics of infrared focal plane arrays, fixed pattern noise elimination, a.k.a. non-uniformity
correction (NUC), and bad pixel replacement are considered as the most crucial calibration processes for
capturing details of the scene. In this paper, we present two different NUC methods from two different families
(temperature and integration time based NUC), together with a bad pixel detection strategy in order to achieve
wide dynamic range and maximized contrast span.