loading
Papers Papers/2022 Papers Papers/2022

Research.Publish.Connect.

Paper

Paper Unlock

Authors: Dániel Vince ; Renáta Hodován and Ákos Kiss

Affiliation: Department of Software Engineering, University of Szeged, Dugonics tér 13, 6720 Szeged, Hungary

Keyword(s): Spectrum-based Fault Localization, Test Case Reduction, Fuzz Testing.

Abstract: Spectrum-based fault localization (SBFL) is a popular idea for automated software debugging. SBFL techniques use information about the execution of program elements, recorded on a suite of test cases, and derive statistics from them, which are then used to determine the suspiciousness of program elements, thus guiding the debugging efforts. However, even the best techniques can face problems when the statistics are unbalanced. If only one test case causes a program failure and all other inputs execute correctly, as is typical for fuzz testing, then it may be hard to differentiate between the program elements suspiciousness-wise. In this paper, we propose to utilize test case reduction, a technique to minimize unnecessarily large test cases often generated with fuzzing, to assist SBFL in such scenarios. As the intermediate results, or by-products, of the reduction are additional test cases to the program, we use these by-products when applying SBFL. We have evaluated this idea, and ou r results show that it can help SBFL precision by up to 49% on a real-world use-case. (More)

CC BY-NC-ND 4.0

Sign In Guest: Register as new SciTePress user now for free.

Sign In SciTePress user: please login.

PDF ImageMy Papers

You are not signed in, therefore limits apply to your IP address 3.133.117.113

In the current month:
Recent papers: 100 available of 100 total
2+ years older papers: 200 available of 200 total

Paper citation in several formats:
Vince, D.; Hodován, R. and Kiss, Á. (2021). Reduction-assisted Fault Localization: Don’t Throw Away the By-products!. In Proceedings of the 16th International Conference on Software Technologies - ICSOFT; ISBN 978-989-758-523-4; ISSN 2184-2833, SciTePress, pages 196-206. DOI: 10.5220/0010560501960206

@conference{icsoft21,
author={Dániel Vince. and Renáta Hodován. and Ákos Kiss.},
title={Reduction-assisted Fault Localization: Don’t Throw Away the By-products!},
booktitle={Proceedings of the 16th International Conference on Software Technologies - ICSOFT},
year={2021},
pages={196-206},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0010560501960206},
isbn={978-989-758-523-4},
issn={2184-2833},
}

TY - CONF

JO - Proceedings of the 16th International Conference on Software Technologies - ICSOFT
TI - Reduction-assisted Fault Localization: Don’t Throw Away the By-products!
SN - 978-989-758-523-4
IS - 2184-2833
AU - Vince, D.
AU - Hodován, R.
AU - Kiss, Á.
PY - 2021
SP - 196
EP - 206
DO - 10.5220/0010560501960206
PB - SciTePress