D
1
diagnoses with certainty the faults belonging
to one of
Π
F1
,
Π
F2
and
Π
F4
while D
2
diagnoses with
certainty the faults belonging to one of
Π
F2
,
Π
F3
and
Π
F4
. Finally (7) holds since the delay required to
diagnose a fault belonging to one of the fault
partitions, in the worst case and for any one of the
two diagnosers, is finite and equal to 6 events. If we
consider the non-satisfaction of an expected
consequent as an event then starting from any
diagnoser state of the desired behavior, the longest
event sequence required to decide the occurrence of
a fault is maximally equal to 6. As an example,
starting from the state 7 of D
1
, the detection of the
occurrence of a fault belonging to one of
Π
F1
,
Π
F2
or
Π
F4
requires, respectively, 6 events (state 21), 5
events (state 20) and 5 events (state 19). Thus, the
system is F-codiagnosable.
1110
15
F
1
↑
R
↓
a
↑
b
↓
b
↓
R
↑
b
0010
17
F
2
1000
1
N,F
1
,F
2
,F
4
1010
2
N,F
1
,F
2
,F
4
0010
3
N,F
1
,F
2
0110
4
N,F
1
,F
2
0010
5
N,F
1
,F
2
0000
7
N,F
1
,F
2
,F
4
1010
16
F
4
abRL
q
l
D
1
0110
18
F
2
1101
20
F
2
↓
b
↑
a
↑
L
0001
21
F
1
0001
8
N,F
1
,F
2
,F
4
0101
10
N,F
1
,F
2
0100
11
N,F
1
,F
2
,F
4
0101
12
N,F
1
,F
2
,F
4
0001
13
N,F
1
,F
2
1001
14
N,F
1
,F
2
↓
L
↑
b
↑
L
↓
L
1010
19
F
4
↑
a
EF
↑
L
(
↓
b
↑
a
)=1
EF
↑
L
(
↑
L
↓
b)=1
EF
↑
R
(
↓
a
↑
b)=1
EF
↑ R
(
↑
R
↓
a)=1
EF
↑ R
(
↓
b
↑
b)=1
Figure 3: Local event-state-based diagnoser, D.
1
1110
22
F
2
0001
27
F
2
↑ R
↑ b ↓ b ↑ c ↓ R
↑ L ↓ b
↑ L
↑c
1010
23
F
2
0000
1
N,F
2
,F
3
,F
4
0010
3
N,F
2
,F
3
,F
4
1010
4
N,F
2
,F
3
,F
4
0010
5
N,F
2
,F
3
0110
6
N,F
2
,F
3
0100
7
N,F
2
,F
3
,F
4
0101
8
N,F
2
,F
3
,F
4
0001
9
N,F
2
,F
3
1110
26
F
3
bcRL
q
l
D
1001
10
N,F
2
,F
3
,F
4
1000
11
N,F
2
,F
3
,F
4
1001
12
N,F
2
,F
3
0001
13
N,F
2
,F
3
↑ b ↓ c
0010
24
F
3
↓ L
↓ L
1001
28
F
4
↑ b
0101
25
F
4
EF
↑
L
(↑ L↓ b)=1
EF
↑
L
(↓ c↑ b)=1
EF
↑
R
(↓ b↑ b)=1
EF
↑
R
(↓ b↑ c)=1
EF
↑
L
(↑ L↓ c)=1
Figure 4: Local event-state-based diagnoser, D
2
.
4 CONCLUSIONS
In this paper, a decentralized diagnosis approach is
proposed to diagnose manufacturing systems. This
approach is based on several local diagnosers. They
diagnose together faults, which violate the
specification language representing the desired
behavior of the monitored system.
A simulation tool based on Stateflow of Matlab
®
is constructed in order to test and validate the
proposed approach on application examples. This
tool is based on a library of component models to
design and to test the performances of diagnosis
module for different applications.
We are developing a distributed diagnosis
module to perform the diagnosis of manufacturing
systems. This module uses the timed-event-state-
based diagnoser, proposed in this paper, as a local
diagnoser in a distributed structure.
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