Applicability of Quality Metrics for Ontologies on Ontology Design Patterns

Rebekka Alm, Sven Kiehl, Birger Lantow, Kurt Sandkuhl

2013

Abstract

Ontology Design Patterns (ODPs) provide best practice solutions for common or recurring ontology design problems. This work focuses on Content ODPs. These form small ontologies themselves and thus can be subject to ontology quality metrics in general. We investigate the use of such metrics for Content ODP evaluation in terms of metrics applicability and validity. The quality metrics used for this investigation are taken from existing work in the area of ontology quality evaluation. We discuss the general applicability to Content ODPs of each metric considering its definition, ODP characteristics, and the defined goals of ODPs. Metrics that revealed to be applicable are calculated for a random set of 10 Content ODPs from the ODP wiki-portal that was initiated by the NeOn-project. Interviews have been conducted for an explorative view into the correlation of quality metrics and evaluation by users.

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Paper Citation


in Harvard Style

Alm R., Kiehl S., Lantow B. and Sandkuhl K. (2013). Applicability of Quality Metrics for Ontologies on Ontology Design Patterns . In Proceedings of the International Conference on Knowledge Engineering and Ontology Development - Volume 1: KEOD, (IC3K 2013) ISBN 978-989-8565-81-5, pages 48-57. DOI: 10.5220/0004541400480057


in Bibtex Style

@conference{keod13,
author={Rebekka Alm and Sven Kiehl and Birger Lantow and Kurt Sandkuhl},
title={Applicability of Quality Metrics for Ontologies on Ontology Design Patterns},
booktitle={Proceedings of the International Conference on Knowledge Engineering and Ontology Development - Volume 1: KEOD, (IC3K 2013)},
year={2013},
pages={48-57},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0004541400480057},
isbn={978-989-8565-81-5},
}


in EndNote Style

TY - CONF
JO - Proceedings of the International Conference on Knowledge Engineering and Ontology Development - Volume 1: KEOD, (IC3K 2013)
TI - Applicability of Quality Metrics for Ontologies on Ontology Design Patterns
SN - 978-989-8565-81-5
AU - Alm R.
AU - Kiehl S.
AU - Lantow B.
AU - Sandkuhl K.
PY - 2013
SP - 48
EP - 57
DO - 10.5220/0004541400480057