PLANE WAVE DIFFRACTION BY A THIN MATERIAL STRIP:
HIGHER ORDER ASYMPTOTICS
Takashi Nagasaka, Kazuya Kobayashi
Department of Electrical, Electronic, and Communication Engineering, Chuo University
1-13-27 Kasuga, Bunkyo-ku, Tokyo 112-8551, Japan
glong169@gmail.com, kazuya@tamacc.chuo-u.ac.jp
Keywords: material strip, approximate boundary conditions, asymptotic expansion, radar cross section, Wiener-Hopf
technique
Abstract: The plane wave diffraction by a thin material strip is analyzed using the Wiener-Hopf technique together
with approximate boundary conditions. An asymptotic solution is obtained under the condition that the
thickness and the width of the strip are small and large compared with the wavelength, respectively. The
scattered field is evaluated asymptotically based on the saddle point method and a far field expression is
derived. Scattering characteristics of the strip are discussed via numerical results of the radar cross section.
1 INTRODUCTION
The analysis of the scattering by material strips is an
important subject in electromagnetic theory and
radar cross section (RCS) studies. Volakis (1988)
analyzed the plane wave diffraction by a thin
material strip using the dual integral equation
approach (Clemmow, 1951) and the extended
spectral ray method (Herman and Volakis, 1987)
together with approximate boundary conditions
(Senior and Volakis, 1995). In his 1988 paper,
Volakis first solved rigorously the diffraction
problem involving a single material half-plane, and
subsequently obtained a high-frequency solution to
the original strip problem by superposing the singly
diffracted fields from the two independent half-
planes and the doubly/triply diffracted fields from
the edges of the two half-planes. Therefore his
analysis is mathematically not rigorous from the
viewpoint of boundary value problems, and may not
be applicable unless the strip width is relatively
large compared with the wavelength.
In this paper, we shall consider the same problem
as in Volakis (1988), and analyze the plane wave
diffraction by a thin material strip for both H and E
polarizations with the aid of the Wiener-Hopf
technique. Analytical details are presented only for
the H-polarized case, but numerical results will be
shown for both H and E polarizations.
Introducing the Fourier transform of the scattered
field and applying approximate boundary conditions
in the transform domain, the problem is formulated
in terms of the simultaneous Wiener-Hopf equations,
which are solved exactly via the factorization and
decomposition procedure. However, the solution is
formal since branch-cut integrals with unknown
integrands are involved. We shall further employ an
asymptotic method established by Kobayashi (2013)
to derive a high-frequency solution to the Wiener-
Hopf equations, which is expressed in terms of an
infinite asymptotic series and accounts for all the
higher order multiple diffraction effects rigorously.
It is shown that the higher-order multiple diffraction
is explicitly expressed in terms of the generalized
gamma function introduced by Kobayashi (1991).
Our solution is valid for large strip width and
requires numerical inversion of an appropriate
matrix equation. The scattered field in the real space
is evaluated asymptotically by taking the Fourier
inverse of the solution in the tranform domain and
applying the saddle point method. It is to be noted
that our final solution is uniformly valid in incidence
and observation angles. Numerical examples of the
RCS are presented for various physical parameters
and far field scattering characteristics of the strip are
discussed in detail. Some comparisons with Volakis
(1988) are also given. The results presented in this
paper provide an important extension of our earlier
analysis of the same problem (Koshikawa and
Kobayashi, 2000; Nagasaka and Kobayashi, 2013).
The time factor is assumed to be
and
suppressed throughout this paper.
Plane Wave Diffraction by a Thin Material Strip:
Higher Order Asymptotics
Nagasaka T. and Kobayashi K.
Plane Wave Diffraction by a Thin Material Strip: Higher Order Asymptotics.
DOI: 10.5220/0005421800940099
In Proceedings of the Third International Conference on Telecommunications and Remote Sensing (ICTRS 2014), pages 94-99
ISBN: 978-989-758-033-8
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