Simulation of Capture Capability based on Rectangular Ion Trap

Li Qi

2015

Abstract

In the ion optical simulation software, the capture capability of RIT designed was studied by simulation, thus affecting researches on initial position and radio-frequency voltage of ion trap. Thereinto, both frequency and voltage are the main influence factors of capture capability based on RIT. Simulation shows that the smaller the distance between ion and the center of ion trap, the more the possibility of capture. Therefore, suitable radio-frequency voltage and distance should be designed to ensure high-probability capture. In the work, the simulation demand in practice is analyzed in term of research on capture capacity of RIT.

References

  1. Bai Chuanyi, Sun Qi, Gu Changxin, Shan Liying, Modeling and Simulation of Mass Spectrum of Rectangular Ion Trap, Chinese Journal of Vacuum Science and Technology, 2010(06): 571-576.
  2. Chen Yi, Tang Fei, Wang Xiaohao, Simulation and Optimization of RIT Based on Numerical Analysis, Analytical Chemistry, 2013(10): 1577-1581.
  3. Huang Zejian, Xiong Xingchuang, Fang Xiang, Development and Performance of a Desktop Mass Spectrometer based on Rectangular Ion Trap, Modern Science Instrument, 2008(04): 50-53.
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Paper Citation


in Harvard Style

Qi L. (2015). Simulation of Capture Capability based on Rectangular Ion Trap . In Proceedings of the Information Science and Management Engineering III - Volume 1: ISME, ISBN 978-989-758-163-2, pages 296-299. DOI: 10.5220/0006024602960299


in Bibtex Style

@conference{isme15,
author={Li Qi},
title={Simulation of Capture Capability based on Rectangular Ion Trap},
booktitle={Proceedings of the Information Science and Management Engineering III - Volume 1: ISME,},
year={2015},
pages={296-299},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0006024602960299},
isbn={978-989-758-163-2},
}


in EndNote Style

TY - CONF
JO - Proceedings of the Information Science and Management Engineering III - Volume 1: ISME,
TI - Simulation of Capture Capability based on Rectangular Ion Trap
SN - 978-989-758-163-2
AU - Qi L.
PY - 2015
SP - 296
EP - 299
DO - 10.5220/0006024602960299