A Method to Improve the Precision of Interferometric
Phase-recognization under Open-loop PZT Drive
Liangen Yang, Xuanze Wang, Bingkang Liu, Zhongsheng Zhai and Tao He
School of Mechanical Engineering, Hubei University of Technology, Nanhu, Wuhan, China
Keywords: Phase Recognization, Four Steps Algorithm, Ellipse Fitting, Lagrange Interpolation, Open-loop PZT Drive.
Abstract: For the monochromatic light interferometry under open-loop PZT drive, a high precision method for phase
recognization that satisfies the four steps phase-shift algorithm is proposed. The total idea of the phase
recognization method is as follows. Firstly, two pixels with suitable phase-difference are selected from the
interference field and the interference equations of the two pixels' gray values are established in one driven
cycle of PZT. Secondly, the parameters of interference equations can be obtained by using ellipse fitting
algorithm. Thirdly, the point-to-point step length of PZT drive and sequence phases can be determined
through reverse calculation of sequence phases. Finally, in order to calculate initial phase of every pixels
four interference grayscale images that meet the four steps phase-shift algorithm are designed and calculated
through Lagrange parabolic interpolation. The experimental results have shown that this method decreases
the requirement for hardware, environment and needs less interference grayscale images than traditional
methods. The method can meet the high precision demands of surface topography measurement and has
high processing speed.
1 INTRODUCTION
In the interference measurement of surface
topography by monochromatic light or quasi
monochromatic light, the calculation accuracy of
interferometric phase determines directly the
accuracy of the measurement results. Therefore, the
phase information should be accurately extracted
before unwrapping operation for the interferometric
phase. At present, there are many ways to extract
interferometric phase. For example, three-step
method (Wyant et al., 1984), four-step method
(Wyant, 1982), five-step method (Hariharan et al.,
1987), FFT algorithm (Wang and Da, 2012), wavelet
transform (Cui et al., 2012), phase retrieval method
used for wavelength-scanning (Liu et al., 2014) or
wavelength-tuning Interferometer (Kato and
Yamaguchi, 2000) and so on. The essence of these
algorithms is to obtain the initial phases of
interference sequence of every pixel by eliminating
the influence of amplitude and offset parameters.
The difference among three-step method, four-step
method and five-step method is the anti-noise-
interference ability. The FFT algorithm requires the
interference sequence for a complete cycle and
always needs a large amount of data processing. As
a result, it has low efficiency. Futhermore, these
methods require PZT be closed-loop controlled,
which increases the difficulty and cost of driver
element (Deng, 2014). Because tiny vibration during
measurement process will lead to the driving step
length change and has a great influence on the final
measurement results, the measurement system has
also very high requirements for measuring
environment.
An algorithm for calculating the interference
phase through arbitrary driving step lengths was
presented (Hao et al., 2009). The requirement of the
approach is as follows. Firstly, find out the
maximum and the minimum gray values of a point
in the interference field from the sequence
interference grayscale images. Then the sequence
phases are calculated. Finally, the sequence phases
of every point in the interference field are computed.
The method doesn't require controlling the driving
step length of PZT, but it costs more time on image
acquisition and needs more interference images than
other methods. When the number of interference
images is small, the real maximum and minimum of
gray values cannot be found out. As a result, this
method cannot be used.