fied threshold level, and the second one the values
which do not exceed a threshold level. Afterward,
the denoised data can be reconstructed using an in-
verse transform over the deterministic data pattern co-
efficients. To process the data from standoff exper-
iments toward better recognition many well-known
denoising techniques are presented in the literature,
e.g, Fourier transform (FT), wavelet transform, Haar
transform, and so on (Ahmed and Rao, 1975; Wang,
2012).
In this paper we employ more promising type of
decomposition that are based on the principal compo-
nent analysis (PCA) (Wang, 2012) and can be suc-
cessfully used for the purpose of data denoising –
Karhunen-Lo
`
eve Transform (KLT). We analyze pros
and cons of KLT, and discuss its discrete implemen-
tation. We show that denoising of data with KLT al-
lows to increase the precision of resonance frequen-
cies measurement because of the highest resolution
ability of KLT over any known existing transforms.
The simulation result confirms the high performance
of KLT.
The paper is organized as follows. Section 2 dis-
cusses the microcantilever sensor system analysis and
experimental setup, Section 3 introduces the KLT and
its discrete implementation. Section 4 presents the ap-
plication of KLT to sensitive cantilever experimental
data processing and the result discussion. In Section 5
we discuss the threshold value determination between
deterministic pattern and random fluctuations by in-
volving the correlation analysis. We summarize our
work in Section 6.
2 MICROCANTILEVER SENSOR
SYSTEM ANALYSIS AND
SETUP
Resonant microcantilever is a device that absorbs the
particles and actuates them into vibration of ampli-
tudes. The resonance cantilever frequencies are iden-
tified as peaks of maximal oscillation amplitudes in
the frequency domain, and the resonance frequencies
strongly depend on the nature of the particles. By
measuring a shift in the resonance frequencies the un-
known material can be detected and classified. The
sensitivity of a cantilever is defined by the quality fac-
tor (Q-factor) that determines the resolution, and, as a
result, the precision of resonance frequency shift mea-
surement. The Q-factor of a cantilever is a specified
value that depends on the cantilever geometry, ma-
terial elasticity and mass. A change in mass due to
interaction with the surrounding gases causes a shift
in the resonance frequency of vibrating cantilever.
The higher the Q-factor, the higher the sensitiv-
ity of sensor and, as a result, the narrower the res-
onance peak bandwidth; hence, a shift in resonance
frequency can be detected and estimated with high
precision. However, despite the high Q-factor pro-
vides high sensitivity, the response of the sensor is
rather slow. As shown in (Albrecht et al., 1991) for
a cantilever with Q = 50, 000 and a resonance fre-
quency f
r
= 50 kHz, the maximum available band-
width is only 0.5 Hz, corresponding to the respond
time τ = 2Q/2π f
r
= 0.32 s, which is too long for
many applications. The dynamic range of high sen-
sitivity sensor is also restricted due to high ampli-
tude response on the resonance frequency. Because of
mentioned constraints, using the cantilever with very
high Q-factor in majority applications is undesirable.
Low Q-factor cantilevers operate with faster re-
sponse, but because of their low peaks resolution the
shifting in the resonance frequency can not be esti-
mated precisely, especially when the shift is rather
small. Hence, we have contradictory cantilever im-
plementation requirements: it should operate with a
fast response (requires low Q-factor), and in the same
time it should be highly sensitive providing high res-
olution (requires high Q-factor) . Satisfaction to both
conditions is a big challenge and an acceptable solu-
tion sometimes does not exist. Therefore, the goal of
this paper is to achieve the high peak resolution spec-
tra of low Q-factor cantilevers by using KLT.
In our test the microcantilever dynamics is moni-
tored via optical beam deflection in atomic force mi-
croscopy (AFM) head. The signal of AFM, S(t),
is split and sent to four channels of a digitizing os-
cilloscope, where the four channels are captured in
rapid succession, each channel measurement contain-
ing 10,000 points sampled at 200 ns intervals. Farther,
we analyze the 4th channel data.
Let us consider S(t) as the signal representing the
relevant observable in the cantilever dynamics, that is,
the deformation u(x,t) at a given x. The vibrations of
AFM cantilever, u(x,t), can be described by a partial
differential equation using the Euler Bernoulli beam
theory
EI
∂
4
u(x,t)
∂x
4
+ ρA
∂
2
u(x,t)
∂
2
= 0. (1)
where E is the Youngs modulus, I is the second mo-
ment of inertia of the cross section, ρ is the mass
density, and A is the cross sectional area (Measures,
1984).
In the absence of any external driving forces, S(t)
represents the equilibrium state of u(x,t) and the ac-
cumulative random fluctuations in the entire system,
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