Table 1: Percentage of amplitude distribution in respective diffraction orders for different apodizing masks - result of the
simulations.
Mask shape 1st order 2nd order 3rd & 4th order
No apodization 17,74% 15,76% 27,31%
Gaussian mask (w
1
= 4 µm) 19,29% 22,08% 24,59%
Gaussian mask (w
2
= 3,5 µm) 20,36% 28,30% 21,79%
Gaussian mask (w
3
= 3 µm) 21,64% 39,26% 16,52%
Gaussian mask (w
4
= 2,5 µm) 22,48% 55,51% 8,58%
Sinusoidal mask 22,99% 69,97% 5,34%
Table 2: Normalized percentage of the amplitude distribution in respective diffraction orders for different apodizing masks -
result of the simulations.
Mask shape 1st order 2nd order 3rd & 4th order
No apodization 100% 100% 100%
Gaussian mask (w
1
= 4 µm) 82,92% 106,84% 68,64%
Gaussian mask (w
2
= 3,5 µm) 66,19% 103,60% 46,03%
Gaussian mask (w
3
= 3 µm) 51,60% 105,37% 25,59%
Gaussian mask (w
4
= 2,5 µm) 38,50% 107,03% 9,54%
Sinusoidal mask 33,38% 114,40% 5,04%
predicted, the amplitude masks allowed a change of
the distribution of the reconstructed images and while
the results obtained are not yet ideal for the proposed
purpose, the conducted research creates the possibil-
ity of optimising the masks parameters. Additionally,
displaying the image in between the intensity peaks
of main diffraction orders with the use of a carrier-
frequency would have the advantage of increasing re-
construction efficiency with the observed gain of in-
tensity in both first and second order of diffraction.
5 EXPERIMENT
The simulations are the first step of confirming the
postulated hypothesis and because of the limita-
tions of theoretical models, experimental proof is
favourable. Especially the sinusoidal mask presents
the greatest opportunity of experimental application
due to its structure. In this paper we name a few of
the possible application approaches.
The simplest of them would be mask fabrication
and its positioning by the SLM surface in the set-up
analogous to the one presented in Figure 1. It should
be noted, however, that in such case the wavefront
propagates twice through the amplitude mask. The
shape of the mask should be then corrected. Using the
Talbot self-imaging length could eliminate said obsta-
cle, with the periodic structure reconstruction, up to
a constant multiple, at a distance. The mask itself can
be created precisely by the means of electrolitogra-
phy or, in a simplistic case, by recording a hologram
of an interference pattern of two plane waves, creat-
ing a sinusoidal structure in one of the dimensions.
In the latter instance, care should be taken to accu-
rately apply the correct angle between the waves. An-
other possible approach to the spatial light modulator
apodization is a direct interference of two waves on
the SLM plane.
6 SUMMARY
In this work, a solution to the intensity leakage in
the image reconstruction of the computer-generated
Fourier hologram was proposed. The higher diffrac-
tion orders are one of the reasons for the intensity de-
crease of the main image, thus we proposed the ef-
fective change of the pixel shape to reduce this effect.
The apodizing structures described in this paper, that
is Gaussian and sinusoidal masks, are not necessarily
optimal for this purpose, however, intensity redirec-
tion to lower diffraction orders was still observed. It
is a common practice to display the image off-axis
with the use of holographic diffraction gratings, thus
the final projection can benefit from the obtained in-
tensity raise of both first and second orders.
Conducted simulations support the hypothesis that
it is possible and relatively uncomplicated to alter the
obtained amplitude distribution by the use of the am-
plitude mask, and control the change by modifying
parameters of the mask. In order to analyse both
masks of different shapes and experimental results for
the simulated data, further study of the subject is nec-
essary.
PHOTOPTICS 2018 - 6th International Conference on Photonics, Optics and Laser Technology
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