ACKNOWLEDGMENT
This work was performed under the following
financial assistance award 70NANB14H012 and
70NANB19H005 from U.S. Department of Com-
merce, National Institute of Standards and Technol-
ogy as part of the Center for Hierarchical Materi-
als Design (CHiMaD), DND-CAT located at Sector
5 of the Advanced Photon Source (APS) at Argonne
National Lab supported by DOE under Contract No.
DE-AC02-06CH11357, the MRSEC program of the
National Science Foundation (DMR-1720139), and
the Soft and Hybrid Nanotechnology Experimental
(SHyNE) Resource (NSF NNCI-1542205). Partial
support is also acknowledged from DOE awards DE-
SC0014330, DE-SC0019358.
REFERENCES
Baraldi, A. and Blonda, P. (1999). A survey of fuzzy clus-
tering algorithms for pattern recognition. ii. IEEE
Transactions on Systems, Man, and Cybernetics, Part
B (Cybernetics), 29(6):786–801.
Bergerhoff, G., Hundt, R., Sievers, R., and Brown, I.
(1983). The inorganic crystal structure data base.
Journal of chemical information and computer sci-
ences, 23(2):66–69.
Bezdek, J. C. (1981). Objective function clustering. In
Pattern recognition with fuzzy objective function al-
gorithms, pages 43–93. Springer.
Bish, D. L. and Post, J. E. (1989). Modern powder diffrac-
tion, volume 20. Mineralogical Society of America
Washington, DC.
Bunn, J. K., Hu, J., and Hattrick-Simpers, J. R. (2016).
Semi-supervised approach to phase identification
from combinatorial sample diffraction patterns. JOM,
68(8):2116–2125.
Chung, J.-S. and Ice, G. E. (1999). Automated index-
ing for texture and strain measurement with broad-
bandpass x-ray microbeams. Journal of applied
physics, 86(9):5249–5255.
Cullity, B. (1978). Elements of xrd diffraction, addition-
wesley. Reading, MA.
Gilmore, C. J., Barr, G., and Paisley, J. (2004). High-
throughput powder diffraction. i. a new approach to
qualitative and quantitative powder diffraction pattern
analysis using full pattern profiles. Journal of applied
crystallography, 37(2):231–242.
Hattrick-Simpers, J. R., Gregoire, J. M., and Kusne, A. G.
(2016). Perspective: Composition–structure–property
mapping in high-throughput experiments: Turning
data into knowledge. APL Materials, 4(5):053211.
Iwasaki, Y., Kusne, A. G., and Takeuchi, I. (2017). Com-
parison of dissimilarity measures for cluster analysis
of x-ray diffraction data from combinatorial libraries.
npj Computational Materials, 3(1):4.
Jha, D., Kusne, A. G., Al-Bahrani, R., Nguyen, N., Liao,
W.-k., Choudhary, A., and Agrawal, A. (2019). Peak
area detection network for directly learning phase re-
gions from raw x-ray diffraction patterns. In 2019
International Joint Conference on Neural Networks
(IJCNN), pages 1–8. IEEE.
Jones, E., Oliphant, T., Peterson, P., et al. (2001–). SciPy:
Open source scientific tools for Python. [Online; ac-
cessed ¡today¿].
Klug, H. P. and Alexander, L. E. (1974). X-ray diffrac-
tion procedures: for polycrystalline and amorphous
materials. X-Ray Diffraction Procedures: For Poly-
crystalline and Amorphous Materials, 2nd Edition, by
Harold P. Klug, Leroy E. Alexander, pp. 992. ISBN 0-
471-49369-4. Wiley-VCH, May 1974., page 992.
Moore, D. M. and Reynolds, R. C. (1989). X-ray Diffraction
and the Identification and Analysis of Clay Minerals,
volume 322. Oxford university press Oxford.
Park, W. B., Chung, J., Jung, J., Sohn, K., Singh, S. P., Pyo,
M., Shin, N., and Sohn, K.-S. (2017). Classification of
crystal structure using a convolutional neural network.
IUCrJ, 4(4):486–494.
Peters, G., Crespo, F., Lingras, P., and Weber, R. (2013).
Soft clustering–fuzzy and rough approaches and their
extensions and derivatives. International Journal of
Approximate Reasoning, 54(2):307–322.
Tatlier, M. (2011). Artificial neural network methods for the
prediction of framework crystal structures of zeolites
from xrd data. Neural Computing and Applications,
20(3):365–371.
Warner, J. Scikit-fuzzy: A fuzzy logic toolbox for scipy.
Woolfson, M. M. and Woolfson, M. M. (1997). An introduc-
tion to X-ray crystallography. Cambridge University
Press.
ICPRAM 2021 - 10th International Conference on Pattern Recognition Applications and Methods
514