Infrared Microscopic Imaging Analysis
Anselmo Jara, Guillermo Machuca, Sergio Torres and Pablo Gutiérrez
Departamento de Ingeniería Eléctrica, Universidad de Concepción, Casilla 160-C, Concepción, Chile
Keywords: Image Formation, Acquisition Devices and Sensors, Image Enhancement and Restoration.
Abstract: In this paper, we present imaging processing advances and applications of mid-wavelength infrared
(MWIR) microscopy imaging. Practical issues related to imaging acquisition, image nonuniformity
correction, infrared image quality assessment, and even the MWIR microscope optical Point Spread
Function experimental estimation are discussed. The built-up MWIR microscope imaging system allows us
to analyse thermal features near to the system diffraction limit, up to 200 frames per second and to focus on
less than 2 mm
2
area. On basis of this technology, our group has been focused efforts in exothermal
biological processes, achieving the results exposed in this paper.
1 INTRODUCTION
Infrared (IR) imaging systems enable users to
determine the thermal spatial distribution of a target
object in a non-invasive manner, and furthermore,
without requiring any physical contact between the
target and the imaging system. IR imaging sensors
are based on the Infrared Focal Plane Array (IRFPA)
technology that consists of a mosaic of independent
photo-detectors placed at the focal plane of an
imaging system (D. A. Scribner et al., 1991).
Every image acquisition system can be
considered as a cascade formed set-up, which is
mainly composed by a physic interface and an
electronic interface. The physic interface is used to
focus the irradiance on the IRFPA, even more, in
such unit, the image is magnified by an array of
lenses. The electronic interface collects the
irradiance by means of an IRFPA located exactly in
the Focal Plane, to filter and digitalize the electric
data as a raw image output data.
Nevertheless, the detectors in the array has
unequal responses under a homogeneous stimulus,
which leads to the presence of a Fixed Pattern Noise
(FPN) noise, well known as Non-uniformity (NU)
noise, on the resulting images. Furthermore the lens
aberrations effect causes a spatial degradation
namely blurring (V. N.Mahajan., 1998). Thus, NU
noise and blurring degrade image quality and lead to
major difficulties in MWIR microscopic imaging
analysis for all kinds of applications.
In the literature, scene-based techniques perform
the NU correction (NUC), using only the video
sequences that are being imaged, not requiring any
kind of laboratory calibration technique (P. M.
Narendra., 1980, S. N. Torres and M. M. Hayat,
2003, E. Vera et al., 2011). However in blurring
correction, the problem needs to characterize the
optical array in order to inversely solve the image
degradation. Several deconvolutive methods have
been developed to allow the best image restoration
(N. Wiener, 1949, W. H. Richardson, 1972, L B.
Lucy, 1974).
Our research group is currently working: in
MWIR microscopic imaging applications (mainly to
exothermal biological processes). Particularly, on
MWIR video signal analysis (NUC and de-blurred
algorithms and IR imaging performance metrics),
and on MWIR microscopic parameters (Diffraction
Limit, Instantaneous Field Of View, point spread
function (PSF)). Here we present, some of our most
recently results.
This paper is structured as follows. In Section 2,
we describe the microscopy instrumentation and IR
microscopy imaging features are exposed. In Section
3 an experimental PSF estimation method from the
IR microscope system is sumarized. In Section 4, we
tested an algorithm to correct simultaneously the NU
noise and blurring artifacts. To evaluate the
technique performance, a novel metric is computed
in Section 5. Finally, in Section 6 we present the
conclusions and future research.
Jara, A., Machuca, G., Torres, S. and Gutiérrez, P.
Infrared Microscopic Imaging Analysis.
DOI: 10.5220/0006716702130218
In Proceedings of the 13th International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications (VISIGRAPP 2018) - Volume 4: VISAPP, pages
213-218
ISBN: 978-989-758-290-5
Copyright © 2018 by SCITEPRESS – Science and Technology Publications, Lda. All rights reserved
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