is organized as follows. The Sec. 2 will introduce the
data origination and statistic principles, Subsequently,
the Sec. 3 will display the results of linear regression.
Afterwards, the explanation of the results as well as
the limitation of the method will be demonstrated in
Sec. 4. Eventually, a brief summary is given in Sec. 5.
2 DATA &METHOD
If a sample n is taken without replacement from a
finite (small) population of size N in which M has an
attribute (and hence N – M do not possess that
attribute), the number of sample units (Wang 2021), X
possessing that attribute follows a Hyper-geometric
distribution with parameters N, M, n. Probability mass
function (pmf) is:
𝑝
𝑥
= 𝑃
𝑋 = 𝑥
=
𝑀
𝑛−𝑚
– 𝑥
𝑁
1
This probability can also be directly obtained using
Excel Function-Statistical-Hypgeomdist. If X~B(n,
p). i.e., X has Binomial Distribution with parameters
n and p, where n = number of trials and p = probability
of one success, then, probability mass function (pmf)
of X is given by
𝑝
𝑥
= 𝑃
𝑋 = 𝑥
=𝑛
𝑝
1 − 𝑝
2
This probability can also be directly obtained using
Excel Function: Statistical, BINOMDIST. To work
out the solution, N = 500, n = 25, Number of
defectives in the lot = 2, i.e., proportion of defectives
in the lot, p = 0.004. Let X represents number of
defectives found in a sample of 25. Current system
(LATM), one can easily get the data. Based on Eq. (1),
X ~ Hyper-geometric with N = 500, M = 2, n = 25. P
(lot is accepted) = 0.9976. Proposed system (ICTM),
Here X ~ B (25, 0.004), P (lot is accepted) = 0.9047.
Table 1: Table Type Style.
Year
Sales
Volume
Market
demand
Price per
chip
Condition
2004 2.39 297 0.832 0
2005 3.82 332 0.844 1
2006 3.33 195 0.854 0
2007 2.49 182 1.155 1
2008 1.56 93 1.303 0
2009 0.97 98 1.265 0
2010 1.32 198 1.368 1
2011 1.42 188 1.208 0
2012 1.48 285 1.234 1
2013 1.85 264 1.282 1
The variables for regression are summarized in
Table. I. For the same lot size and defective level,
ICTM would reject the lot more often than LATM.
Thus, it is more stringent. Flaw in the current system.
For a defective level of 0.4%, an acceptance number
of 1, which out of 25 is 4%, is clearly too lenient.
Consequently, lots with higher defectives level are
likely to get accepted and passed on to the customer.
Primarily, one needs to count the expression of the
exponentially distributed, and its probability density
function is f(x)=λe
–λx
(λ>0), when λ<0, f(x)=0.
Besides, its distribution function is F(x)=1-e
-λx
. From
the picture “probability density function”, one can
easily know that when x=5, f(x)=4.1% (assuming that
x=time before IC chip failure (in years)). On this basis,
the expression can be derived as 0.041=λe
-5λ
. However,
at this time, one can easily solve this problem, because
the data is not integer. Thus, it should use the
distribution function to help us simplify the count
process, through two expressions, one can easily know
the number of λ instead of using complicated count
(Choi 2021). According to the data, one finds that x=5,
F(x)=0.2255 (assuming that x=time before IC chip
failure), i.e., 0.2255=1-e
-5λ
. Then put two equations
together, one gets that the λ=0.041/0.7745=0.053
(assuming that e=2.7), i.e., the f(x)=0.053e
-0.053x
and
F(x)=1-e
-0.053x
. Besides, Customer PQR systems
request that the chips will last more than 6 years, i.e.,
x≥6. Substituting x=6, the F(x)=0.27, f(x)=3.86%. In
this case, Mark is confident that ABCtronics should be
able to meet the expectation of the client Customer
PQR systems.
They have again started experimenting with their
quality control. Circuit module M (CM) has a path
where three chips from ABCtronics get connected in
a series. Before the new testing process, XYZsoft
reported that in a typical lot comprising 20 CMs they
are finding three defective items. In most of those
cases, they observed that the problem was with our
chips. Now, they have put a stricter policy in place.
They have now started to calculate the number of
nondetective before they encounter a particular
number of defectives.
According to the exponentially distribution, the
probability of chip failure keeps decreasing as the time
period increases (Lee 2017). Based on the cross
comparison with the cumulative distribution function
of failure time, the graph of the cumulative
exponential function also shows a decrease in
its slope,
meaning that the chance to fail shrinks after year 5,
which results in an up to forty-year long-lasting value
of IC chips. This is an evident reason why the mark
was so confident that PQR systems expectations can
be met. The increase in the number of complaints
regarding ABCtronics’ IC chips started when
XYZsoft was required to retrieve the whole lot of