EMplifier: Hybrid Electromagnetic Probe for Side Channel and Fault

Injection Analysis

Fabrizia Marrucco, Mosabbah Mushir Ahmed, Bechir Bouali and Alieeldin Mady

Qualcomm Technologies, Cork, Ireland

Keywords: Hardware Security, Offensive Security, EM-FI, SCA.

Abstract: Electromagnetic Fault Injection (EM-FI) analysis is increasingly emerging as an effective technique to bypass

countermeasure and/or leak sensitive information by injecting fault during the execution of sensitive

asset/operation. EM-FI analysis becomes an essential requirement for obtaining product security certification,

whenever high assurance is claimed. The coils represent an integral part of the EM probe design. Therefore,

it is important to focus on the practical study of coil design that accentuate the efficiency of EM capture and

emission. In this work we tried to optimize the design of a hybrid coil (called EMplifier) that can efficiently

sense the EM emissions and inject the fault, enabling a guided fault injection analysis with a single coil. This

state-of-art investigates the various important coil parameters that can be used in a hybrid scenario of both

capturing and emitting EM signals. Such design is useful in practical EM-FI setup where identifying the exact

injection location over the chip is a key factor towards successful attacks.

1 INTRODUCTION

High security assurance is rapidly becoming an

industrial requirement for assets connected to

internet, ranging from smart garage door openers,

smart home locks, smart TVs, and handsets to

automobiles. These connected Internet-of-things

(IoT) and Cyber-Physical Systems (CPS) link

together devices that were previously isolated, where

critical application and infrastructure enforce the high

assurance security requirements (Li et al., 2016).

Providing high security assurance starts by

building a highly resilient hardware, which acts as a

root of trust for software components on top

(Mansour & Lauf, 2020). Hardware is produced in a

mass-production with a static security footprint,

where a successful attack on a single device can lead

to reducing resiliency of applications use this

hardware. Software patching has an easier process

than hardware in case of vulnerability identification,

hence industry has been enforcing a high security

assurance requirement for security critical

application, such as banking, payment terminals,

passport. Common Criteria certification (CC) scheme

(Common Criteria, 2022) was introduced to

formulate a security evaluation standardization by

levelling the security assurance level using

Evaluation Assurance Level (EAL). CC scheme has

introduced a disruptive change in the industrial

landscape, where hardware security requirements

were benchmarked against the application domain

used by this hardware, e.g., passport and banking

applications require EAL7 to reflect the maximum

assurance level.

Hardware security evaluation considers two main

attack categories: Side-Channel Analysis (SCA) and

Fault injection (FI) attacks. Side-channel analysis

(Koeune & Standaert, 2005) aims to extract

secrets/keys from chips through measuring and

analysing hardware physical parameters, such as

power consumption, response time, and EM

emission. Fault injection analysis (Barenghi et al.,

2012) aims to gain privileges or extract secrets/keys

by modifying the device execution flow by injecting

faults using different medium, such as voltage/clock

glitching, body-biasing (BBI), EM-FI and laser

emissions (L-FI).

EM-FI, BBI and L-FI are classified as localised-

FI attacks, where fault in precisely injected on the

die’s backside to perturbate targeted asset in isolation

of the surrounded subsystems/assets. The isolation

nature of the localised-FI leads to a high precision and

effective perturbation, which increasingly emerges as

a common method in evaluating System-On-Chip

(SoC) security resiliency. Within localised-FI, EM-FI

Marrucco, F., Ahmed, M., Bouali, B. and Mady, A.

EMpliﬁer: Hybrid Electromagnetic Probe for Side Channel and Fault Injection Analysis.

DOI: 10.5220/0012431800003648

Paper published under CC license (CC BY-NC-ND 4.0)

In Proceedings of the 10th International Conference on Information Systems Security and Privacy (ICISSP 2024), pages 815-822

ISBN: 978-989-758-683-5; ISSN: 2184-4356

815

has gained a significant recognition by offensive

security community due to the attack cost efficient,

where an optimal compromise is achieved between

attack cost versus effectiveness (Barenghi et al.,

2012; Dehbaoui et al., 2012).

Developing EM-FI attack follows multiple stages,

where identifying the optimal injection location over

the die is a key stage towards a successful attack.

Typically, side-channel EM leakage is useful to

identify the optimal location of the injection, based on

the maximum leakage location for the targeted assets.

Even though EM medium is used for both side

channel leakage and fault injection, two different

probes will be required with manual switching.

Passive EM sensing probe is used to evaluate the EM

leakage, whereas fault is injected by active EM probe.

Switching between these two probes is challenging

due to the required micrometre scale precision

needed. The use of an XYZ table can help in

obtaining an approximate location but doesn’t allow

us to have a high precision.

While certain studies have investigated into

optimizing the design of EMFI coils and others have

focused on enhancing sensing coils designs, no prior

research has attempted to identify an optimal design

that consider both aspects. In this work our primary

focus has been on developing a hybrid coil, called

EMplifier, where EMplifier aims to efficiently

monitor EM emission (i.e., passive EM-probe) and

inject EM signal (i.e., active EM-probe).

Although the probe for both SCA and FI requires

certain amount circuit elements like amplifier,

switches, pulse generator etc., the design of other

parts of the probes is not in the scope of this work.

The main contributions are manyfold, listed as

follows:

 Comprehension of design parameters of the

probe that affect the FI and SCA capability.

 Design of a novel hybrid EM-probe coils,

enabling multi-stage FI attack.

 Experimental study for optimising EMplifier

design parameters.

2 RELATED WORKS

We can identify two types of EM-FI platforms. The

single probe type requires two different probes used

for passive and active operations. The dual EM-

probe, proposed in this paper, is used to perform EM

injections and side-channel measurements.

Regarding the design of EM-FI probes several

research have been conducted. For instance, in (Gaine

et al., 2022) the characteristics of EM-probe to

increase the effectiveness of the EM injection while

limiting the requirement of high voltages has been

studied. The key characteristics are selecting a soft

high permeability ferrite for probe's core and

overlaying the probe coil turns. Moreover,

ChipShouter (NAE-CW520, n.d.) is widely used

EMFI platform in hardware research community. The

tool can generate up to 500 V. The probes provided

with the tool are 1 mm or 4 mm in diameter. The core

is made of ferrite. Also, SiliconToaster (Abdellatif &

Heriveaux, 2020) is a custom EM-FI platform. The

tool can produce a pulse of 1200 V. The EM probe

used with SiliconToaster is built from a flat coil of 6.6

mm diameter with 9 turns. The core is made of ferrite

with a 4.5 mm diameter and 10 mm length. Despite

this, the only commercial solution capable of

injecting EM pulses and performing EM

measurement simultaneously using the same probe is

the EM-FI Transient Probe with Adjustable Pulse

width (EM-FI Transient Probe Adjustable Pulse

Width - Riscure, n.d.) that can generate up to 100 V

(power over coil). Nevertheless, no public details

related to characteristics of the probe design have

been published.

In comparison to the related studies, this work

focusses on the fundamental aspects of EM probe i.e.,

the coil. A thorough investigation is made to

understand the important characteristics of the coil

pertaining to both FI and SCA. Furthermore, in

comparison to this existing hybrid commercial design

(EM-FI Transient Probe Adjustable Pulse Width -

Riscure, n.d.), this work investigates the coil aspect

of the EM-FI probe, whereas the existing commercial

tools do not give the explicit detail of the different

aspects of the probe that contributes to the hybrid

nature. On the other hand, in applications where

precise location of the EM emission is needed can be

achieved by recording the XYZ co-ordinate, but such

an architecture still requires changing the probes

manually that can be expensive in terms of time and

mechanical adjustments/errors. EMpilfier design can

inhibit the use of such multiple probe settings.

3 PRELIMINARIES

The two main aspects that determines the operation

of the EM probe coils are:

 EM interaction mechanisms

 Field region

First, the coupling laws are based on Biot-

Savart’s law and Faraday’s law. The first is a

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816

fundamental quantitative relationship between an

electric current I and the magnetic flux B that it

produces. This law is the basis of the phenomenon

whereby, having obtained a current through the coil,

it generates a magnetic field proportional to the

current that generated it. The generated magnetic

field can then generate an induced current according

to the well-known Faraday's law (Kinsler, 2020;

Oliveira & Miranda, 2001). These laws are applicable

for both SCA (also referred as signal sensing in this

paper) and FIA (fault injection attacks).

Secondly, the field of interest for this work and in

general FI and SCA testing is the near-field region.

This region has complex characteristic and

approximations rules. Consequently, obtaining

accurate simulation is particularly complex (Nikitin

et al., 2007) and changes in the design of the coils can

significantly affect its efficiency in terms of FIA and

SCA. Moreover, is not possible to have a complete

control over all the parameters that will affect the FIA

success rate or the SCA sensitivity.

3.1 Parameters Characteristics

Utilizing the aspects or features stated above, a set of

parameters are selected that are utilized for the

effective design of the EM probes. The design of the

probe is categorized into two parts: (1) selection of

parameters, (2) design and test. For the first part,

parameters are classified under certain sub-categories

- independent parameters set (IPS) and dependent

parameter set (DPS). The characteristic of the IPS is

that they consist of variables that can be controlled

while designing the probe. This set of parameters

could include dimensions of the solenoid, the spacing

between the coils, the number of turns, and the

material used. The outcome of IPS decides the DPS.

Some of the DPS observed during the EM probe

design and testing are the signal amplitude, resonant

frequency, sensitivity etc.

Due to the complexity of simulating the

interaction between the EM coil and the DUT, it is not

possible to show with high precision how changing

the values of the IPS will affect all the DPS values.

Therefore, before going into the design phase, a

procedure has been conducted and can be summarize

with the Algorithm 1. This procedure has the aim of

evaluating if the values chosen for the IPS will make

the DPS values correspond with the expected

requirements, ‘test_req’ in the Algorithm 1. Due to

the hybrid nature of the EM probe, it is necessary that

the choice of IPS is significative for both SCA and

FIA or, in other words, that IPS(FI) and IPS(SCA)

have interjection.

A list of important sets of DPS and IPS taken into

consideration while designing the probe are

highlighted in Table 1. Observing from Table 1, IPS

are approximately common for both SCA and FIA

although the DPS can vary. Therefore, this

interjection is decisive in the choice of design

parameters as they will correspond to the common

IPS.

3.2 DPS Parameters Brief

In this section, some of the important DPS that are

critical to be understood for the design of hybrid coil,

are briefly discussed.

Damping of the Injected Current. Ideally for FI it

is better to have a critically damped response refer

that will result in a value that can be approximated as

in (1) if the circuit can ideally be represented as an

RLC circuit (Beckers et al., 2020), as shown in:

=









(







)

(1)

here, I is the current, V

is the initial voltage, R

and L are resistance and inductor respectively

(Dannehl et al., 2011). Over-damping would increase

the pulse-width, while under-damping results in

ringing. The amount of coupling between the probe

and the device itself changes with the frequency of

the EM pulse.

Coupling. Different frequencies can result in

different values of coupling effecting the induced

current and overall system behaviour. This frequency

dependency complicates the study and

comprehension of the EM-pulse injection process.

Directivity. It measures the concentration of the

radiation pattern of the probe in a particular direction.

A higher directivity indicates a better focus and

signal-to-noise ratio (SNR) values of the field /

signals. It applies to both FI and SC equally. This

makes it less sensitive to noise (or signals) coming

from other directions or sources.

Algorithm 1: Selection of parameters.

1.procedure: CalculateDPSDecideIPS(test_req’):

2. select the test requirements ‘test_req’

3. check if DPS = test_req’ |

4. if test_req meets certain conditions:

5. DPS = calculate_DPS_based_on_’test_req’

6. if criteria_for_DPS_are_fulfilled(DPS):

7. IPS = make_decision_based_on_DPS(DPS)

8. else

9. reset IPS

10. end procedure

EMpliﬁer: Hybrid Electromagnetic Probe for Side Channel and Fault Injection Analysis

817

Table 1: Parameters example list for the probe design.

Parameter Variables

DPS (SCA) Signal-to-noise ratio (SNR), Directivity,

Coupling between DUT and probe

IPS (SCA) No. of turns, Type of core, Diameter of the coil

DPS (FI) Power of the injected EM field, Coupling

between DUT and probe, Directivity, Damping

IPS (FI) No. of turns, Type of core, Diameter of the coil

4 EMPLIFIER DESIGN

The efficiency of a hybrid EM probe’s coil is

determined by some important parameters that define

the limitations and range of its working frequency,

power etc. Those independent values, the IPS effects

DPS values and are the one we can control when

designing the probe. From the selection phase and the

requirements (test_req from Algorithm 1), several

important aspects (that can be part of IPS) have been

identified. These are also illustrated in Figure 1.

Figure 1: Different IPS sets used during the design of the

hybrid EM-probe. (a) Flat shape (b) Sharp-tip.

4.1 Number of Turns (N)

Number of turns (N) is an important characteristic of

the probes, changing its value effects both FI and SC

capability. In one the first studies on the N required

for FI, it is shown, with the help of simulation results,

that only a single loop (turn) would be sufficient

however (Omarouayache et al., 2013), as research

progressed in this area, it has been observed that one

loop does not seem to be the most effective solution

in the case of FI (Ordas et al., 2017).

As an important aspect for FI, the goal is not to

generate the highest magnetic field amplitude, but to

preferably maximize the rate of change of H-field at

the rising and falling edges of the pulse as it will

affect the induced current value. When the number

of windings increases, the inductance (L) is expected

to rise quadratically with the number of windings

(Beckers et al., 2020).

=













(2)

From (2), kµ

determines the material properties –

magnetic permeability, the other part of equation

A/l shows the geometrical characteristics – number

of turns, area, length of solenoid respectively. Going

back to (2) it can be observed that with increased L,

the current (I) decreases, but at the same time it

impacts positively for the B refer to (3), where R is

the parameter that determines the radius of the core

(solenoid).

=

μ





2

[



]

(3)

In general, it could be possible to assume that if N

increases, under certain limits, the two effects will

slightly compensate each other (Caciagli et al., 2018).

Also, damping of the circuit depends on L, the time

window of the interaction between the EM pulse and

circuit also is determined by multitude of the

parameters and one of them is the N. In the case of

under-damped condition, there can be number of

harmonics that can further cause chain of faults (or

multiple faults), the under-damped condition can be

achieved by increasing the time-window of

interaction which in turn depends upon N.

Regarding the value of N used for the SCA, in

general a single loop with a variable gap size is used.

On the other hand, as pointed out in (2) a high L value

of the coil, at any frequency, is necessary because it

increases the SNR and sensitivity for eddy-current

testing. Resorting to Algorithm 1, for selection of IPS

values (in this case N), empirical approaches are used

recursively, using equations discussed above. Once

the empirical approach sets the required test_req, the

DPS obtained can be said to satisfy the requirements.

Taking into considerations all the parameters and

equations involved, and the previous research about

FI, after some initial characterization, the N used in

this study is between 4-7. The differences in the

results for each N value is highlighted in section 5.

Similar approach has been used in deciding the

core, length of solenoid and probe shape i.e. make use

of Algorithm 1 and intersection of IPS and DPS

parameters.

4.2 Choice of Core (Air vs Ferrite)

The core of the probe can be filled with a

ferromagnetic element like ferrite or just left with air

as core. There are various discussions on the pros and

cons ferrite core can have. The main purpose of a

magnetic core is to provide a convenient path for flux,

enabling flux linkage or coupling (DPS) between

multiple elements. The magnetic flux produced by the

coil prefers to flow through the ferrite rather than

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818

through the air. Consequently, the ferrite core

concentrates the magnetic field near the centre of the

probe, which in turn concentrates the eddy currents in

that region. Referring to ( W. Zhu et al., 2011) the

cores acts as the flux linkage path between the circuit

winding and a non-magnetic gap that is connected to

the core. Such properties are very much useful for the

FI technique.

For SCA part, ferrite core can work like a ferrite

rod antenna that is a small magnetic loop antenna

used in RFID applications. It is designed with a rod

made of ferrites and includes a coil wound around it (

D. Giri. 1977). The use of ferrite helps in

channelizing the EM mission into the probe, thus

reducing the noise (better directivity and SNR)

coming from other sources. Hence in this work it has

been found that filling a ferrite core is more

advantageous for both SCA and FI with empirical

results.

4.3 Shape of Probe

From previous studies it has been deduced that the

best shapes for the EM probe for FI are - flat, crescent,

and sharp (

Chusseau, L et. al., 2014). The flat shape is

widely used, however the sharp shape has shown very

good results as it allows for better spatial resolution

since the diameter of the tip is much smaller than in

the flat shape, while still maintaining a high

inductance value. This concentration is expected to

enhance the accuracy and precision of the spatial

resolution, making it more directive (DPS). The

crescent shape is to create a circular magnetic field

that is intentionally concentrated between the two

ends of the ferrite(Trabelsi et al., 2019). This design

aims to minimize magnetic pollution and interference

within the space that separates the two ends of the

ferrite.

Table 2: Summary of hybrid EM probes.

Probe

name

Shape Diameter(mm) No. of

turns

Core

Type

R1 Flat 2 4 Ferrite

R2 Flat 3 4 Ferrite

G1 Flat 2 7 Ferrite

G2 Flat 3 7 Ferrite

P1 Sharp 5 7 Ferrite

P2 Sharp 2 7 Ferrite

For the SCA part, the focus is to localize the field

through probe shape. The probe shape like flat and

sharp have been characterized and tested for SCA

because these shapes aid in capturing the radiation

pattern while have good inductance value. Therefore,

this work uses flat and sharp-tip probes.

4.4 Length of Solenoid

In terms of FI, decreasing the length of the solenoid

has the positive effect of increasing the value of the

inductance refer (2) and (3). There are two strategies

which can be employed. Either the wire thickness can

be reduced, or windings can be overlapped. For the

SCA part, is important to take in account that longer

coils result in a reduction of coupling (DPS) between

source and pick-up coils. A longer coil will also mean

a lower inductance value and a worse SNR.

4.5 Coil Architecture

Based upon the investigation of different parameters

a list of coils designed using such is given in Table 2.

The coils in this table are consequence of cumulating

parameters that forms part of IPS and DPS for both

SCA and FI applications. A correlation with the

designed coil and different parameters described are

also highlighted in Figure 1.

5 EXPERIMENTAL DESIGNS

Based on the conjunction of all the parameter sets,

experiments are carried out. The experiments

highlight the efficiency of various probes designed

with parameters determined above. Also, a Figure-of-

merit is discussed that shows the effects of various

parameters involved in the design of an efficient

hybrid-EM probe.

The coils are designed using the study carried out

in previous sections (also refer Table 2). Since not

much information can be found about the use of

ferrite probes with copper windings in the side-

channel case, the number of turns is chosen within a

range of {4-7}, following the indication obtain from

the previous research in terms of FI efficiency. For

similar reasons, the diameter of the core is fixed in a

range of {2-5mm}. In all the cases, the two ends of

the wire are soldered to an SMA connector. This

connects the probe to the pulse generator, in the FI

setup, and to the preamplifier, in the SCA setup.

Execution of both FI and SCA experiments are

divided into experimental setup and testing phase.

5.1 Execution of FI

First part of experiment is the execution of FI on the

selected DUT and observe it results. The details of

experiment and results are given below.

EMpliﬁer: Hybrid Electromagnetic Probe for Side Channel and Fault Injection Analysis

819

5.1.1 Setup for FI

A typical setup to perform the EM-FI, consists of a

pulse generator, an XYZ table, and software to

orchestrate all components, as is shown in Figure.

2(a). For all the produced probes the position and the

distance from the DUT has been fixed to be able to

compare them.

Figure 2: A typical setup for experiments. (a) EM-FI. (b)

EM-SCA.

In this work ChipSHOUTER from newAE®, has

been used for pulse generation. This device can

generate one or multiple pulses in a range from 150

to 500V with a pulse-width from 80 to 960ns.

Fundamentally, the ChipSHOUTER provides a high

voltage charge that is discharged through an inductor

(EM probe), that generates a powerful magnetic field

that can be used to induce faults in a target device

(Dehbaoui et al., 2012; NAE-CW520, n.d.). Pulses can

be triggered by internal or external trigger logic. The

DUT in this work has been an Arduino Mega2560,

based on the 8-bit AVR microcontroller

ATmega2560. This target has been chosen over other

available MCUs, like the Arduino UNO, because of

his thinner package, that makes the penetration of the

EM through the package easier, without requiring any

decapsulation. The pulse generator has been mounted

on a XYZ table that allows to move the EMFI probe

to the attack location. Faults injected by EM fields are

location dependent.

5.1.2 Testing Phase

For the FI experiment, a counter loop test program is

used to evaluate possible number of injected faults

each of the built probes (refer Table 2). A serial

communication is used that establishes the trigger the

start of test program.

Using a Python script, the PC establishes a serial

connection also with the ChipSHOUTER from

newAE® and reset both the devices. An internal

trigger is used, that is programmed and set by initial

characterization. The pulse voltage value used in this

Figure 3: FI results from different types of probes.

work are 350 and 450V termed as V1 and V2

respectively. The delay from trigger is set at 200ms

obtained after initial characterization. The pulses

repetition is between 1 and 3.

For every designed EM probe, 250 pulses have

been injected to see how many faults it is possible to

obtain. The expected value of the counter is 25000, so

values like 25001 and 24999 have been taken as

successful faults termed as SF_1 and SF_2

respectively. Every other obtained value is considered

under others category. Moreover, the number of

resets occurred is taken in account. There are six

probes designed refer Table 2. For the FI part each

probe has classifications or groups based on voltage

and repetition rates. There are 24 configurations of

probes tested for the FI part. Each probe, voltage level

and repetition rate are grouped under one

configuration for better understanding of results. For

instance, R1V11 corresponds to probe R1, voltage

used is 350V (V1) and the repetition is 1. The result

for the FI part with all the probe is shown in Figure 3.

Referring Figure. 3, it is not straightforward to

precisely find which of the coil is the best among all,

however using approximate result from Figure. 3, it

can be deduced that for flathead G1 and sharp-edge

P1 have yielded better results. The choice depends on

the DUT type, testing environment, algorithm type

etc.

5.2 Execution of SCA

In the second part of the experiment, the coils are

tested to evaluate their ability to sense the EM

emissions. The setup for

the SCA part is depicted in

Figure. 2(b). Here a pre-amplifier is used which is

used that enhances the SNR of the EM emission

sensed by the probes. In this work PA306 from

Langer has been as a low noise preamplifier. Also in

this case, during the first characterization, a side-

channel commercial probe has been used to identify a

spot where the emission where easily detected and

this spot has been used to compare all the built probes,

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820

kept at direct contact with the DUT. The DUT is, also

in this case, the Arduino MEGA-2560, but the test

algorithm is AES-128, a symmetric key

cryptographic algorithm. It is done so, because EM

emission from loop counter algorithm is not easily

distinguishable, whereas for AES-128 (Dehbaoui et

al., 2012), the EM emission characteristic is well-

known, and it is convenient to detect that on the DUT

used here also. Like FI, for SCA probe is moved in

XYZ direction and spot in decide from where

maximum emission is observed.

For more analytical analysis, an FFT has been

applied to the sensed signal to evaluate the gain (in

dBm) at the fundamental frequency of 16MHz, that is

equal to the clock frequency of the Arduino Mega, as

shown in the Figure 4. From the result in Table 3, it

is observed that for both NF-based and FFT

calculation, the G1 and P1 seems to show better

results. Although empirically NF-based solution

helps to observe signal analysis in the time domain,

the result for sensing a signal is more accurately be

considered in the frequency domain. The results from

Figure 4 and Table 3, suggests that coils G1 and P1

are suitable hybrid EM probe. But this is applicable

for the DUT used in this work. The results highly

depend upon DUT, test platform, algorithm etc.

Table 3: Results of emission for different probes.

Probes G1 G2 R1 R2 P1 P2

FFT

(dBm)

-4.51 -7.12 -6.02 -9.64 -6.66 -6.01

(mV)

508.4 495.3 376.9 490.9 541.2 531.6

5.3 Figure-of-Merit

As seen from the above results, when using such a

hybrid-EM probe, a trade-off is needed to meet the

requirements for SCA and FIA. In this case, an

empirical formula has been proposed in (4):

 =









1

+

1

2

(4)

where, 



is magnetic permeability, N is no. turns,

D1 and D2 are diameters of the core refer Figure 5.

The expression obtained considers how the IPS and

the DPS values will correspond to the test

requirements (test_req).

The (D1/D2) factor has been added to consider

the shape of the tip. This suggests empirically that the

bigger the FM value is, the better the trade-off

between sensing and injecting capability is.

Figure 4: EM emission observed from hybrid probe. (a)

AES rounds with Noise Floor approach. (b) FFT of AES

emission.

Figure 5: A basic geometry of flathead and sharp-tip probe.

6 CONCLUSION

In this paper a thorough study has been conducted on

characteristics and parameters of EM coil. Using this

study, a novel hybrid nature of EM coil has been

designed, and subsequently a figure-of-merit is

proposed. The experiments conducted on FI and SCA

parts highlights that the designed hybrid coils can

sense and emit the EM signals to/from the DUTs. The

experimental results showcase that such designs can

enable a novel guidance-based EM-FI techniques,

significantly increasing the EM-FI effectiveness,

while reducing the attack model cost and complexity.

As a future effort, the EM probe setting will be

evaluated against lower nano-meter tech nodes.

REFERENCES

Abdellatif, K. M., & Heriveaux, O. (2020). SiliconToaster:

A Cheap and Programmable EM Injector for Extracting

Secrets. 2020 Workshop on Fault Detection and

Tolerance in Cryptography (FDTC), 35–40.

https://doi.org/10.1109/FDTC51366.2020.00012.

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