
5 CONCLUSION
In this paper, we proposed a novel method for one-
shot per-pixel material classification based on the
polarimetric clues under the optimal illumination.
Specifically, we show the relationship between the in-
tensities of multi-spectral and multi-directional light
sources and the polarimetric feature, and jointly opti-
mize both the non-negative illumination condition for
feature extraction and the discriminant hyperplane in
the feature space via margin maximization. Then, we
experimentally showed that our method using a single
input image works better than/comparably to the ex-
isting methods using a single/multiple input images.
The future work of this study includes the exten-
sion to complex objects such as non-planar surfaces
and translucent materials with significant subsurface
scattering. The use of the other modalities such as
polarimetric light sources is another direction of our
future work.
ACKNOWLEDGEMENTS
This work was supported by JSPS KAKENHI
Grant Numbers JP20H00612, JP23H04357, and
JP22K17914.
REFERENCES
Chen, C., Zhao, Y., Luo, L., Liu, D., and Pan, Q. (2009).
Robust materials classification based on multispectral
polarimetric brdf imagery. In SPIE Proceedings, vol-
ume 7384, pages 220–227.
Chen, H. and Wolff, L. (1998). Polarization phase-based
method for material classification in computer vision.
IJCV, 28(1):73–83.
Ghosh, A., Achutha, S., Heidrich, W., and O’Toole, M.
(2007). BRDF acquisition with basis illumination. In
Proc. IEEE ICCV2007, pages 1–8.
Gill, P., Murray, W., and Wright, M. (1981). Practical Op-
timization. Academic Press.
Gu, J. and Liu, C. (2012). Discriminative illumination:
per-pixel classification of raw materials based on op-
timal projections of spectral BRDF. In Proc. IEEE
CVPR2012, pages 797–804.
Ibrahim, A., Tominaga, S., and Horiuchi, T. (2010). Spec-
tral imaging method for material classification and in-
spection of printed circuit boards. Optical Engineer-
ing, 49(5):057201.
Ichikawa, T., Fukao, Y., Nobuhara, S., and Nishino, K.
(2023). Fresnel microfacet BRDF: Unification of
polari-radiometric surface-body reflection. In Proc.
IEEE/CVF CVPR2023, pages 16489–16497.
Kondo, Y., Ono, T., Sun, L., Hirasawa, Y., and Murayama,
J. (2020). Accurate polarimetric BRDF for real polar-
ization scene rendering. In Proc. ECCV2020, pages
220–236.
Liang, Y., Wakaki, R., Nobuhara, S., and Nishino, K.
(2022). Multimodal material segmentation. In Proc.
IEEE/CVF CVPR2022, pages 19800–19808.
Liu, C. and Gu, J. (2014). Discriminative illumination: per-
pixel classification of raw materials based on optimal
projections of spectral BRDF. IEEE Trans. PAMI,
36(1):86–98.
Ma, W.-C., Hawkins, T., Peers, P., Chabert, C.-F., Weiss,
M., and Debevec, P. (2007). Rapid acquisition of spec-
ular and diffuse normal maps from polarized spheri-
cal gradient illumination. In Proc. EGSR2007, pages
183–194.
Park, J.-I., Lee, M.-H., Grossberg, M., and Nayar, S. (2007).
Multispectral imaging using multiplexed illumination.
In Proc. IEEE ICCV2007, pages 1–8.
Pernkopf, F. and O’Leary, P. (2003). Image acquisition
techniques for automatic visual inspection of metallic
surfaces. NDT&E International, 36:609–617.
Schechner, Y., Nayar, S., and Belhumeur, P. (2003). A
theory of multiplexed illumination. In Proc. IEEE
ICCV2003, pages 808–815.
Shurcliff, W. (1962). Polarized Light: Production and Use.
Harvard University Press.
Tominaga, S. and Okamoto, S. (2003). Reflectance-based
material classification for printed circuit boards. In
Proc. IEEE ICIAP2003, pages 238–244.
Vapnik, V. (1998). Statistical Learning Theory. Wiley-
Interscience.
Wang, C. and Okabe, T. (2017). Joint optimization of
coded illumination and grayscale conversion for one-
shot raw material classification. In Proc. BMVC2017.
Wolff, L. (1990). Polarization-based material classifica-
tion from specular reflection. IEEE Trans. PAMI,
12(11):1059–1071.
Xie, E., Wang, W., Yu, Z., Anandkumar, A., Alvarez, J.,
and Luo, P. (2021). SegFormer: Simple and efficient
design for semantic segmentation with transformers.
In Proc. NeurIPS2021, pages 12077–12090.
Zheng, H., Kong, L., and Nahavandi, S. (2002). Automatic
inspection of metallic surface defects using genetic al-
gorithms. Journal of Materials Processing Technol-
ogy, 125–126:427–433.
One-Shot Polarization-Based Material Classification with Optimal Illumination
745