Ground Resistance Measurement Method Based on High-Frequency Pulses

Yuhe Zhang, Hao Zhang

2023

Abstract

In recent years, many substations have expanded accidents due to lightning strikes, most of which are related to unqualified grounding resistance of the ground grid, so vigorously strengthening the regular monitoring of the ground resistance of the ground grid has become an important task. At present, the common use of high and low voltage and low frequency AC, high voltage low and high frequency AC, high and low voltage variable frequency AC, high and low voltage DC, etc. flows through the measured body, testing the ground resistance, impedance, the AC or DC used, the frequency is single, and the rising and falling edges are slow, and the ground impedance is inductive impedance, capacitive impedance or pure resistance impedance can not be well reflected. In order to solve the above problems, a grounding resistance test method based on low-voltage high-frequency pulse voltage is proposed.

Paper Citation

in Harvard Style

Zhang Y. and Zhang H. (2023). Ground Resistance Measurement Method Based on High-Frequency Pulses. In Proceedings of the 2nd International Seminar on Artificial Intelligence, Networking and Information Technology - Volume 1: ANIT; ISBN 978-989-758-677-4, SciTePress, pages 253-256. DOI: 10.5220/0012280300003807

in Bibtex Style

@conference{anit23,
author={Yuhe Zhang and Hao Zhang},
title={Ground Resistance Measurement Method Based on High-Frequency Pulses},
booktitle={Proceedings of the 2nd International Seminar on Artificial Intelligence, Networking and Information Technology - Volume 1: ANIT},
year={2023},
pages={253-256},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0012280300003807},
isbn={978-989-758-677-4},
}

in EndNote Style

TY - CONF

JO - Proceedings of the 2nd International Seminar on Artificial Intelligence, Networking and Information Technology - Volume 1: ANIT
TI - Ground Resistance Measurement Method Based on High-Frequency Pulses
SN - 978-989-758-677-4
AU - Zhang Y.
AU - Zhang H.
PY - 2023
SP - 253
EP - 256
DO - 10.5220/0012280300003807
PB - SciTePress