X-Ray Radiation Effects on SRAM-Based TRNG and PUF

Martin Holec, Jan Bělohoubek, Jan Bělohoubek, Pavel Rous, Tomáš Pokorný, Róbert Lórencz, František Steiner

2025

Abstract

The security primitives, such as True-Random-Number-Generator (TRNG) or Physically-Unclonable-Function (PUF), are widely used in many cryptographic devices. Properties of these primitives affect the security, reliability, and longevity of the whole device. In this work, we evaluate the influence of the total ionizing X-ray dose on hardware structures underlying conventional SRAM-based security primitives – PUF and TRNG. In contrast with other works, we aim with conventional CMOS circuits, we employ lower total ionizing dose (TID) levels, and we also take annealing into account. We quantify the induced changes in SRAM cell entropy, provide a quality analysis of related physical effects, summarize potential effects on both security primitives. Besides analyzing the experimental data, we explain experimental data by comparison to the electrical-level (SPICE) model of SRAM cells taking X-ray-induced effects – flicker noise and threshold shift – into account. Our comparative analysis points to inconsistencies and deficiencies in related literature and provides a view into effects affecting observed entropy. The novelty of our work is in the comparative analysis of experimental data combined with low-level electrical model, which is the enabler of the qualitative analysis. Our results form the basis for future work.

Paper Citation

in Harvard Style

Holec M., Bělohoubek J., Rous P., Pokorný T., Lórencz R. and Steiner F. (2025). X-Ray Radiation Effects on SRAM-Based TRNG and PUF. In Proceedings of the 11th International Conference on Information Systems Security and Privacy - Volume 2: ICISSP; ISBN 978-989-758-735-1, SciTePress, pages 375-384. DOI: 10.5220/0013314100003899

in Bibtex Style

@conference{icissp25,
author={Martin Holec and Jan Bělohoubek and Pavel Rous and Tomáš Pokorný and Róbert Lórencz and František Steiner},
title={X-Ray Radiation Effects on SRAM-Based TRNG and PUF},
booktitle={Proceedings of the 11th International Conference on Information Systems Security and Privacy - Volume 2: ICISSP},
year={2025},
pages={375-384},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0013314100003899},
isbn={978-989-758-735-1},
}

in EndNote Style

TY - CONF

JO - Proceedings of the 11th International Conference on Information Systems Security and Privacy - Volume 2: ICISSP
TI - X-Ray Radiation Effects on SRAM-Based TRNG and PUF
SN - 978-989-758-735-1
AU - Holec M.
AU - Bělohoubek J.
AU - Rous P.
AU - Pokorný T.
AU - Lórencz R.
AU - Steiner F.
PY - 2025
SP - 375
EP - 384
DO - 10.5220/0013314100003899
PB - SciTePress